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Featured Web Seminar
Silicon Test and Yield AnalysisSilicon Test: Low Pin Count Testing (LPCT)
This event will describe several methodologies that enable designers to reduce the number of pins and top level routing required for the application of high quality test. View On-demand Web Seminar
Featured Techpub
FPGAKeep Your FPGA Options Open With Vendor-Independent IP
This white paper introduces and advocates tools that allow designers to create vendor-independent FPGA configurations that can change as new technologies and customer demands emerge. Third-party IP... View Techpub
Atmel Corporation
Atmel Corporation Calibre helped cut time-to-market by up to 10X and provided significant savings in wasted mask and silicon creation costs. Learn More
News
- news: Mentor Graphics Delivers Optimized Android Development System for the OMAP35x Processors from Texas Instruments (Nov 17, 2009)
- news: Mentor Graphics Signs Authorize Pty, Ltd. as New Distributor in Australia (Nov 4, 2009)
- news: Juniper Networks Completes World’s First Network Instruction Set Processor Design Using Mentor Graphics Calibre and Design-for-Test Solutions (Nov 3, 2009)
- news: Mentor Graphics Outlines Strategy to Unify Silicon Test and Yield Analysis (Nov 2, 2009)