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Mentor Blogs

Posts tagged with 'Constrained Random Test'

7 Feb, 2013

Dave Rich The latest revision of the IEEE 1800-2012 SystemVerilog Language Reference Manual (LRM) is about to hit the presses; though I doubt people will be printing the 1300+ pages on their own from the soon to be readily available online version. Here’s a little background into what’s in all those pages. The first SystemVerilog LRM came from Accellera in 2002 as a set of extensions to the IEEE 1364-2001 … Read More

functional coverage, Constrained Random Test, Verification

26 Jul, 2011

Mark Olen Who Doesn’t Like Faster? In my last blog post I introduced new technology called Intelligent Testbench Automation (“iTBA”).  It’s generating lots of interest in the industry because just like constrained random testing (“CRT”), it can generate tons of tests for functional verification.  But it has unique efficiencies that allow you to achieve coverage 10X to 100X … Read More

Functional Verification, Intelligent Testbench Automation, Constrained Random Test, testbench, Verification, iTBA

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