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Posts tagged with 'IJTAG'

20 Mar, 2014
Silicon Test and Yield Analysis

3D Yoga

Posted by Shelly Stalnaker

Shelly Stalnaker

I practice yoga because it helps with my flexibility. Of course, that’s a little like saying that lighting a candle helps with heating your house, but I digress. The point is, flexibility is generally a good thing, and that holds true for 3D ICs and their test strategies. As discussed in the Electrical Engineering Journal, a flexible 3D test strategy that uses a “plug-and-play” architecture

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Silicon Test, Etienne Racine, IC test, 3DIC, Martin Keim, Ron Press, IEEE P1687, IJTAG

18 Feb, 2014

Shelly Stalnaker In Standards & Travels on EE Times, Bruce Swanson reminisces about a trip he took to Europe, long before there were cell phones, a common currency, or even the Internet. Dealing with different languages, different currencies, and different local customs took time, was a bit frustrating, and sometimes led to mistakes (WHERE is this train going?!). His experiences on that trip came to mind recently … Read More

IEEE standard, IJTAG, desgin for test, yield analysis, P1687, Silicon Test

31 May, 2013

Gene Forte The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. The new IEEE P1687 standard, also called IJTAG, simplifies the access, control and testing of embedded IP, and is expected to be rapidly and widely adopted by the semiconductor industry. Mentor Graphics and NXP Semiconductors (NXP) worked together to implement P1687 on mixed-signal IPs in a 65 nm automotive … Read More

IP, P1687, IJTAG

17 May, 2013

admin Integration and testing of IP blocks in large SOCs has been a manual, time consuming design effort. A new standard called IEEE P1687 (or "IJTAG") for IP plug-and-play integration was created to simplify these tasks and EDA tools are emerging to support the standard. IJTAG simplifies connecting any number of IJTAG-compliant IP blocks into an integrated, hierarchical network, allowing access … Read More

IJTAG, IP, IEEE P1687, JTAG, SoC

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