In case you missed the webinar by Jim Culp on November 3rd, I wanted to give you an opportunity to see what you missed. Jim is a Senior Engineer in IBM’s Advanced Physical Design and Technology Integration team. He is leading a team in the development of Parametric DFM and the mitigation of Circuit Limited Yield (CLY). During the webinar he discussed how CLY is becoming the leading contributor to yield … Read More
Physical Verification, Yield, Design Quality, Design for Manufacturing, IC Verification, Leakage, DRC, IC Design