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Posts tagged with 'Ron Press'

20 Mar, 2014
Silicon Test and Yield Analysis

3D Yoga

Posted by Shelly Stalnaker

Shelly Stalnaker

I practice yoga because it helps with my flexibility. Of course, that’s a little like saying that lighting a candle helps with heating your house, but I digress. The point is, flexibility is generally a good thing, and that holds true for 3D ICs and their test strategies. As discussed in the Electrical Engineering Journal, a flexible 3D test strategy that uses a “plug-and-play” architecture

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Silicon Test, Etienne Racine, IC test, 3DIC, Martin Keim, Ron Press, IEEE P1687, IJTAG

17 Mar, 2014

Shelly Stalnaker

Is design-for-test the forgotten stepchild of IC design? Not any more, and DFT engineers can, in large part, thank the automotive industry. The number of processors built into a vehicle is steadily increasing, as we all know (okay, maybe not that guy driving the 1969 Chevy Camaro). These chips have to meet very high standards for quality and reliability, which means the companies who make them need

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automotive test, Silicon Test, Cell-Aware ATPG, cell-aware, ATPG, logic BIST, Cell Aware Test, Ron Press, embedded compression, semiconductor test, iso26262

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