Silicon Test & Yield Analysis Curriculum
- "Digital Systems Testing and Testable Design," by Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman.
- "Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits," by Michael L. Bushnell and Vishwani D. Agrawal.
- "Design-for-Test for Digital IC's and Embedded Core Systems," by Alfred L. Crouch.
- "Build-In Test for VLSI: Pseudorandom Techniques," by Paul H. Bardell, William H.
- "Arithmetic Built-In Self-Test for Embedded Systems," by Janusz Rajski and Jerzy Tyszer.
- "Testing Semiconductor Memories Theory & Practice," by A.J.van de Goor.
- "High Perfomance Memory Testing: Design Principles Fault Modeling and Self-Test" by R. Dean Adams.