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Mentor Graphics TestKompress Supports TSMC Reference Flow 6.0

Improves Test for Manufacturing Quality

WILSONVILLE, Ore., June 9, 2005 - Mentor Graphics Corporation (Nasdaq: MENT) today announced that Taiwan Semiconductor Manufacturing Company (TSMC) has added the TestKompress scan test tool to its Reference Flow 6.0. TestKompress{reg} provides an effective means of increasing volume manufacturing test quality and reducing test cost for nanometer designs. Reference Flow 6.0 also includes Mentor Graphics DFT tool suite-Fastscan™, MBISTArchitect™, and BSDArchitect™.

"Reference flow 6.0 has added new design-for-test technologies that address specific nanometer needs," said Ed Wan, senior director of design service marketing at TSMC. "The Mentor Graphics TestKompress product provides increased test quality while reducing test data volume, test time, and test cost."

The Mentor Graphics TestKompress embedded deterministic test (EDTTM) tool reduces both manufacturing test time and test data volume by up to 100X, helping users increase test coverage and test quality on their complex devices. This compression enables manufacturers to run a large battery of tests without slowing test time, thereby maintaining a low cost of test. The tool also features robust x-state tolerance that eliminates the need to either add functional logic or adhere to strict design requirements imposed by the test structures. In addition, the TestKompress tool fits well into any scan-based methodology, and features a usage methodology that is intuitive to engineers familiar with traditional ATPG.

Both TestKompress and FastScan feature advanced at-speed test capabilities to improve detection of speed-related defects found at smaller process technologies. TSMC has also added the MBISTArchitect and BSDArchitect tools from Mentor Graphics to provide a complete design for test (DFT) tool set in Reference Flow 6.0. MBISTArchitect provides at-speed test of embedded memories operating up to 1GHz; BSDArchitect is used to insert IEEE 1149.1 boundary scan that enables in-circuit test.

"TSMC is an industry leader in meeting the challenges inherent in volume manufacturing of complex nanometer devices," said Robert Hum, vice president and general manager of the Design Verification and Test division for Mentor Graphics. "We are very pleased that Mentor DFT tools have been added to TSMC's Reference Flow 6.0 to meet the specific challenges of cost-effective nanometer production test and improve manufacturing test quality."

About Mentor Graphics Design-for-Test Tools

Mentor Graphics provides the industry's broadest portfolio of DFT solutions for today's System-on-Chip and deep submicron designs, including integrated solutions for scan, ATPG, EDT, advanced memory test, boundary scan, logic built-in self-test and a variety of DFT-related flows. For more information visit: www.mentor.com/products/dft.

About Mentor Graphics

Mentor Graphics Corporation (Nasdaq: MENT) is a world leader in electronic hardware and software design solutions, providing products, consulting services and award-winning support for the world's most successful electronics and semiconductor companies. Established in 1981, the company reported revenues over the last 12 months of over $700 million and employs approximately 3,850 people worldwide. Corporate headquarters are located at 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777; Silicon Valley headquarters are located at 1001 Ridder Park Drive, San Jose, California 95131-2314. World Wide Web site: http://www.mentor.com/.

Mentor Graphics and TestKompress are registered trademarks of Mentor Graphics Corporation. All other company or product names are the registered trademarks or trademarks of their respective owners.

For more information, please contact:

Nate James
Mentor Graphics
503.685.0449
nathan_james@mentor.com

Suzanne Graham
Mentor Graphics
503.685.7789
suzanne_graham@mentor.com

 
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