Design-For-Test (DFT)
- Methodology to ensure a design works correctly after manufacturing
- DFT tools add test circuitry (RTL or gate level) for design testability
- DFT tools generate test sets applied to manufactured designs to detect defects
- DFT-based diagnostics facilitate failure analysis
Technical Events:
- Executive Brief: Meeting the Critical Challenges of IC Implementation
- online
- EDA Tech Forum
Sep 5, 2008 - Tokyo, JP
- EDA Tech Forum (Tokyo)
Sep 5, 2008 - Tokyo, JP
News and Related Articles
- Mentor Graphics Outlines IC Implementation Strategy to Address Sub-45nm ChallengesJun 9, 2008
- Mentor Graphics Aligns Product Groups to Address IC Implementation Challenges at 45nm and BeyondMay 7, 2008
- Mentor Graphics Announces Partnership with NXP Semiconductors for Design-for-Test Tools and TechnologyMay 6, 2008