Experts at the Mentor Graphics Booth

We’ve brought our best researchers and engineers to DAC just to meet you. Find your favorites in the list below. Then hurry and sign up for their sessions, before they fill up!

Featured Experts @ the Booth Events

Verification Today and Tomorrow Monday, June 3, 10:00 AM

Suite Session Every two years, Mentor Graphics commissions Wilson Research Group conducts a broad, vendor-independent survey of design verification practices around the world. This presentation reveals the results of this just-completed study—and the observed convergence of SoC design practices toward a common methodology.

System Level Power Verification and Analysis with Veloce Monday, June 3, 11:00 AM

Suite Session The Veloce hardware emulation system tackles the two primary aspects of power during system-level verification. Power aware verification ensures that power management logic and software control were implemented correctly and that the power functionality of the design is correct. Power analysis identifies activity peaks and drives data to 3rd party power estimation tools. In this session, we will look at both aspects of designing for power and discuss how they can be used independently or collectively for system-level verification.

Verification:  Automate When Possible Monday, June 3, 1:00 PM

Suite Session In the world of ever increasing verification complexity, is anything getting any easier? For some good news on this front, join us for this session where we will examine solutions which add automation to the verification process. Focus areas include: reset and X-state propagation, enhanced coverage through automatic property generation, handling the convergence of multiple clock and power domains, and more!

Introducing Kronos Standard Cell Characterization and Analysis Monday, June 3, 3:00 PM

Suite Session Explore how the Kronos integrated platform for cell library characterization of standard cell, IO pad and complex cells reduces characterization time enabling complex flip-flops that would normally take 30 minutes to complete on a single machine in as little as one minute. Discuss how Kronos Analyzer can compare library correctness and automatically find cell maps between libraries based on cell behavior.

Maximize Verification Cycles with Questa Monday, June 3, 3:00 PM

Suite Session How can you verify twice as much as the last project, in the same amount of time, using the same amount of resource and the same team? This session will focus on what’s new in all areas of the Questa Platform (performance, debug, TB/stimulus creation, coverage closure, low power, SoC verification), and how the platform unifies and automates tools, engines, and methodology into adoptable solutions so that 1+1=3.

Panel: Achieving IC Reliability in High Growth Markets Monday, June 3, 3:00 PM

Suite Panel Several high growth IC markets are experiencing demand for higher reliability, including mobile/wireless, automotive, industrial control and medical. At the same time, factors such as thinner gate oxide and multiple power rails have the potential to introduce subtle design flaws leading to delayed failure mechanisms. This panel will be an interactive forum where experts and attendees on the show floor can discuss the demand for IC reliability, what design methodologies can reduce the occurrence of delayed failure mechanisms, and how design for reliability checks can be automated to help remove the burden from designers. The panel will be immediately followed by a hosted bar happy hour.

Pyxis Open – The New Era in Custom Design – Automating the CORE Monday, June 3, 4:00 PM

Suite Session Mentor Graphics is bringing revolutionary insight and automation to the most manual portions of custom IC design – the core – routing, placement and floor planning. Hear how our revolutionary interactive custom router is changing the competitive game for its users as it shortens routing time by 10X’s and cuts weeks of our customer’s tape out schedules. Also enjoy a sneak preview of our next deliveries for the automation core.

IEEE 1801 UPF Commands and Methodology Monday, June 3, 5:00 PM

Suite Session Power has become a critical design constraint for today’s electronic systems. IEEE 1801 Unified Power Format (UPF) enables specification of power intent to drive both verification and implementation of electronic systems. This session introduces UPF concepts and commands for defining the power management architecture of a system and presents methodology for incorporating power intent into IP and systems design.

Custom IC Design and AMS Verification – Unparalleled Insight and Productivity Tuesday, June 4, 10:00 AM

Suite Session From our complete Custom IC Design flow through our industry leading simulators and analog Mixed Signal verification systems, Mentor Graphics solutions provide insight and productivity. This session will provide a quick overview of what is new across the product portfolio and then focus on the most recent customer results from our industry leading Faster SPICE simulator, Eldo Premier. Join us and learn about our new Electro-Thermal analysis features and how customers are gaining up to 12X performance improvement over traditional SPICE simulation.

Coherent Verification of ARM-based SoCs Tuesday, June 4, 1:00 PM

Suite Session This session will present some of the verification practices needed for efficient validation and verification of ARM v8 family compute sub-systems. We will explore some practical approaches to verification challenges for reuse, scalability and integrating cache coherency systems and solutions. Tues. 13:00, Verifcation Academy booth.

Introducing Kronos Standard Cell Characterization and Analysis Tuesday, June 4, 3:00 PM

Suite Session Explore how the Kronos integrated platform for cell library characterization of standard cell, IO pad and complex cells reduces characterization time enabling complex flip-flops that would normally take 30 minutes to complete on a single machine in as little as one minute. Discuss how Kronos Analyzer can compare library correctness and automatically find cell maps between libraries based on cell behavior.

Panel: Marrying More Than Moore Tuesday, June 4, 3:00 PM

Suite Panel The IC industry will undergo significant changes as future growth is driven not just by traditional Moore’s Law scaling, but also by “More Than Moore” technologies including 3D-IC, MEMS and silicon photonics. As these technologies emerge from R&D into volume production, they will create new opportunities for IC designers to add value to products. They will also challenge designers to find a way to combine the strengths of these technologies and to marry them into a unified EDA flow. This panel will be an interactive forum where attendees on the exhibition floor can exchange ideas and questions with a group of experts who are already grappling with these exciting opportunities and challenges. The panel will be immediately followed by a hosted bar happy hour.

Formal Verification: Myths and Facts Tuesday, June 4, 4:00 PM

Suite Session Formal property checking increases design quality and shrinks project schedules. However, when it comes time to develop your verification plan, it can be difficult to separate formal verification fact from fiction. In this session, we examine some of the common misconceptions about formal verification that interfere with its successful use. We’ll debunk these myths and show you how to use strategies that work!

Pyxis Open – The New Era in Custom Design – Automating the CORE Tuesday, June 4, 4:00 PM

Suite Session Mentor Graphics is bringing revolutionary insight and automation to the most manual portions of custom IC design – the core – routing, placement and floor planning. Hear how our revolutionary interactive custom router is changing the competitive game for its users as it shortens routing time by 10X’s and cuts weeks of our customer’s tape out schedules. Also enjoy a sneak preview of our next deliveries for the automation core.

Bus Fabrics: Make Sure You’re Covered Wednesday, June 5, 3:00 PM

Suite Session Bus fabrics can no longer be ignored during SoC verification, as they can cause designs to fall short of functional and performance requirements. Intelligent testing automates bus fabric verification by generating bus traffic that covers all corner case interactions at speed. Learn how Altera used intelligent testing to verify a complex AMBA bus fabric, achieving first silicon success while saving months of time.

Panel: No Fear of FinFET Wednesday, June 5, 3:00 PM

Suite Panel FinFETs, or so-called 3D transistors, are a key competitive element in all the leading edge IC foundry offerings because FinFETs can achieve much lower power operation than planar transistors. There has been a lot of discussion of the physical and electrical characteristics of FinFETs, but designers are wondering how FinFETs will change the design, verification and test flow. This show floor panel will provide a forum for experts and DAC attendees to learn and interact directly in an informal and entertaining discussion. The panel will be immediately followed by a hosted bar happy hour.

F = Full DAC registration required

IC Design & Test

Angela Wong, Technical Marketing Engineer, Mentor Graphics

  • Preparing for Pervasive Photonics Abstract

    SUITE SESSION Silicon photonics is using silicon for the fabrication of light-based devices—such as lasers, amplifiers, converters, filters and splitters. Current applications include ultra-fast chip-to-chip optical interconnects, optical routers and signal processors. Visionaries see SP as an enabling technology that will impact many facets of life through entertainment, medical discovery, communications, information storage, and manufacturing. This session discusses the impact photonics will have on today’s IC design and manufacturing processes, the tool requirements for SP, foundry options, new applications that will SP open up, and new challenges it will present to IC designers. Tue 2:00, Mentor booth.

Arvind Narayanan, Product Marketing Manager, Mentor Graphics

  • Achieving Best PPA at Advanced Nodes using Olympus-SoC Abstract

    PARTNER KIOSK PRESENTATION One of the predominant P&R challenges is realizing best power, performance and area (PPA), a goal that is more difficult to achieve at advanced nodes due to complex DRC / DFM rules, double patterning, growing design sizes, low power requirements and increasing process and design variations. It is also critical to reduce the die size to justify the cost of moving to smaller nodes. This session shows advanced technologies for efficient design closure such as concurrent PPA optimization, pseudo flat flow methodology and DRC/DP signoff during implementation. Tue 11:00 in the TSMC booth.

Carey Robertson, Director of Product Marketing, Mentor Graphics

  • Advanced Parasitic Extraction for 20nm/16nm and 3D-IC Abstract

    SUITE SESSION The parasitic extraction flow is being challenged on a number of fronts: the need for higher accuracy at smaller dimensions, the complexity of high transistor and gate counts and more extensive fill, the impact of double patterning on modeling and accuracy, the need for new models for FinFETs and Through Silicon Via (TSVs), and the need to handle ECOs in an fast and efficient manner. This session will describe these new challenges and also new approaches to PEX that can deliver the required capabilities while significantly reducing turnaround time.

Ertugrul Demircan, PVG Manager, Freescale

  • Panel: Achieving IC Reliability in High Growth Markets Abstract

    SUITE PANEL Several high growth IC markets are experiencing demand for higher reliability, including mobile/wireless, automotive, industrial control and medical. At the same time, factors such as thinner gate oxide and multiple power rails have the potential to introduce subtle design flaws leading to delayed failure mechanisms. This panel will be an interactive forum where experts and attendees on the show floor can discuss the demand for IC reliability, what design methodologies can reduce the occurrence of delayed failure mechanisms, and how design for reliability checks can be automated to help remove the burden from designers. The panel will be immediately followed by a hosted bar happy hour.

Frank Feng, Circuit Verification Methodologist, Mentor Graphics

  • Reliability Checks for Multiple Markets Abstract

    SUITE SESSION Reliability issues usually require design verification driven from circuit schematics to the corresponding layout data. Traditional DRC engines can’t distinguish the specific functions of layout geometries, so manual markers are required to enable automated checks. However, erroneous markers can jeopardize reliability checking. Calibre PERC provides a fully automated and comprehensive EDA design platform to check ESD, latch-up, EOS, ERC and other design issues in both design and stream out databases. Calibre PERC is the first, and currently the only available tool with a qualified design kit from several major foundries for reliability signoff. In this session, to be presented in Mandarin, Mentor Graphics and Semiconductor Manufacturing International Corporation (SMIC) discuss reliability checking with Calibre PERC. Mon 10:00 in Mentor booth.

Hellen Cheng, Senior Manager, IP Development Center, SMIC

  • Reliability Checks for Multiple Markets Abstract

    SUITE SESSION Reliability issues usually require design verification driven from circuit schematics to the corresponding layout data. Traditional DRC engines can’t distinguish the specific functions of layout geometries, so manual markers are required to enable automated checks. However, erroneous markers can jeopardize reliability checking. Calibre PERC provides a fully automated and comprehensive EDA design platform to check ESD, latch-up, EOS, ERC and other design issues in both design and stream out databases. Calibre PERC is the first, and currently the only available tool with a qualified design kit from several major foundries for reliability signoff. In this session, to be presented in Mandarin, Mentor Graphics and Semiconductor Manufacturing International Corporation (SMIC) discuss reliability checking with Calibre PERC. Mon 10:00 in Mentor booth.

Indavong Vongsavady, Director at ST Central CAD and Design Solutions, STMicroelectronics

  • Panel: No Fear of FinFET Abstract

    SUITE PANEL FinFETs, or so-called 3D transistors, are a key competitive element in all the leading edge IC foundry offerings because FinFETs can achieve much lower power operation than planar transistors. There has been a lot of discussion of the physical and electrical characteristics of FinFETs, but designers are wondering how FinFETs will change the design, verification and test flow. This show floor panel will provide a forum for experts and DAC attendees to learn and interact directly in an informal and entertaining discussion. The panel will be immediately followed by a hosted bar happy hour.

Jean-Marie Brunet, Director of Product Marketing, DFM and Place-and-Route Integration, Mentor Graphics

  • DFM at Advanced Nodes Abstract

    SUITE SESSION At 28 nm and below, litho process checking (LPC), CMP analysis and critical area analysis (CAA) are all crucial steps to help ensure manufacturability. In addition, layout fill has become a more complex and critical issue. While in the past the goal was simply to insert minimum fill to maintain planarity, today you need to maximize fill and place and orient it precisely to optimize its benefits. Come to this session to understand today’s DFM issues, to find out what is required by the foundries at each node, to learn about updates to DFM tools, and to see how SmartFill is changing the approach to fill at advanced nodes.

Joe Sawicki, Vice President & General Manager, Design-to-Silicon Division, Mentor Graphics

  • Panel: No Fear of FinFET Abstract

    SUITE PANEL FinFETs, or so-called 3D transistors, are a key competitive element in all the leading edge IC foundry offerings because FinFETs can achieve much lower power operation than planar transistors. There has been a lot of discussion of the physical and electrical characteristics of FinFETs, but designers are wondering how FinFETs will change the design, verification and test flow. This show floor panel will provide a forum for experts and DAC attendees to learn and interact directly in an informal and entertaining discussion. The panel will be immediately followed by a hosted bar happy hour.

John Ferguson, Director of Marketing, Mentor Graphics

  • Best Practices for 20nm Design Abstract

    SUITE SESSION When leading edge customers first transitioned to 20nm they encountered issues not experienced in prior nodes with the set-up of hardware, flows, and use models during chip verification. TSMC and Mentor worked with these customers to resolve the issues resulting in successful tape-outs of these customers’ designs. TSMC and Mentor will present best practices learned from that experience to help other customers smoothly tape-out their advanced process node designs. Mon 2:00, Mentor booth.

Joseph Adesanya, ASIC Design Manager, Ostendo Technologies

  • Implementing a Quantum Photonic Imager using Olympus-SoC Abstract

    SUITE SESSION Designing a quantum photonic imagers poses a unique challenge to the P&R designers due to the inherent nature of the stacked die interface. This technology has a high density of signal interfaces driven by Analog macros that pose a big challenge during P&R from both a floorplanning and routing perspective. This session will talk about the full netlist to GDS implementation of the photonic imager design done using Olympus. The session will also cover how Olympus was able to handle the unique design requirements specifically from a floorplanning and routing standpoint, and was able to successfully achieve design closure.

Karthik Sundaram, Senior Hardware Engineer, Nvidia Corporation

  • Efficient Chip Assembly & Design Closure flow for large GPUs & Tegras using Olympus-SoC Abstract

    SUITE SESSION With the growing design sizes at advanced nodes, top level chip assembly and optimization is done  using abstracts without the full chip context. This is an highly iterative and manual process that can have a noticeable huge impact on design turn-around time and QoR. In this session we will discuss the chip assembly solution from Olympus-SoC P&R platfomr including key technologies such as top level concurrent MCMM optimization, Synchronous optimization for replicated partitions, top level clock tuning and layer promotion of critical nets for faster timing convergence and design closure.

Ken Amstutz, Sr. Application Engineer, Mentor Graphics

  • Identifying Critical Design Features from Silicon Results Abstract

    PARTNER KIOSK PRESENTATION The ability to effectively identify yield limiting design feature is a key asset for foundries and fabless semiconductor companies. This presentation covers the result of a collaboration between Mentor Graphics and GLOBALFOUNDRIES to rapidly identify systematic defects and critical design features based on silicon data [1-4]. Layout-aware diagnosis identifies the location and classification of defects causing manufacturing test failures. Specialized statistical analysis coupled with design profiling data (such as critical feature analysis) then determines the root cause of yield loss and separates design and process induced defects. Tue 10:00 in the GLOBALFOUNDRIES booth.

KK Lin, Director of Design Enablement, Samsung

  • Panel: No Fear of FinFET Abstract

    SUITE PANEL FinFETs, or so-called 3D transistors, are a key competitive element in all the leading edge IC foundry offerings because FinFETs can achieve much lower power operation than planar transistors. There has been a lot of discussion of the physical and electrical characteristics of FinFETs, but designers are wondering how FinFETs will change the design, verification and test flow. This show floor panel will provide a forum for experts and DAC attendees to learn and interact directly in an informal and entertaining discussion. The panel will be immediately followed by a hosted bar happy hour.

Matthew Hogan, Product Marketing Manager, Calibre Design Solutions, Mentor Graphics

  • Advancing Circuit Reliability at TowerJazz with Calibre PERC Rule Decks Abstract

    SUITE SESSION TowerJazz, the global specialty foundry leader, is now providing Calibre PERC rule decks that enable their customers to perform circuit reliability verification during signoff. TowerJazz provides highly customized electrostatic discharge (ESD) and power management circuit checks based on their specific manufacturing processes. Many of these checks have been automated for the first time by taking advantage of the Calibre PERC product’s unique ability to combine schematic (net list) and physical layout information, which goes beyond the scope of traditional LVS, DRC and ERC tools. This is a one-time, limited seating session for advanced Calibre users. Tue 2:00, Mentor booth.

Michael Buehler-Gracia, Director of Marketing for Calibre Design Solutions, Mentor Graphics

  • Calibre Support for TSMC's 20nm Process Abstract

    PARTNER KIOSK PRESENTATION Mentor will describe advances to support TSMC's 20nm IC processes. Calibre has a new engine with DP anchoring and pre-coloring, DP design rule checking, voltage-dependent checking and patented real-time graphical “error rings” to simplify fixing DP violations. A new 20nm Calibre PERC deck addresses potential reliability issues such as ESD and latch-up. Calibre SmartFill optimizes filling while ensuring that overall run times and files sizes are controlled. The Calibre LFD™ product works with the TSMC Unified DFM Engine, incorporating Calibre Pattern Matching technology to accelerate the litho hot spot detection. Mon 2:30 in the TSMC booth.

Michael Hochberg, Director, OpSIS, University of Delaware

  • Panel: Marrying More Than Moore Abstract

    SUITE PANEL The IC industry will undergo significant changes as future growth is driven not just by traditional Moore’s Law scaling, but also by “More Than Moore” technologies including 3D-IC, MEMS and silicon photonics. As these technologies emerge from R&D into volume production, they will create new opportunities for IC designers to add value to products. They will also challenge designers to find a way to combine the strengths of these technologies and to marry them into a unified EDA flow. This panel will be an interactive forum where attendees on the exhibition floor can exchange ideas and questions with a group of experts who are already grappling with these exciting opportunities and challenges. The panel will be immediately followed by a hosted bar happy hour.

Michael White, Director of Product Marketing, Calibre Physical Verification products, Mentor Graphics

  • Physical Verification with Multi-Patterning for Advanced Nodes Abstract

    SUITE SESSION Physical verification (PV) complexity continues to grow by leaps and bounds as customers move to the advanced nodes that require multi-patterning. Come learn about the emerging trends in PV and how the Calibre nmPlatform continues to rapidly expand, addressing the needs for advanced PV and helping you get your design to market faster.

Ofer Tamir, Director of Design Enablement and Design Support, TowerJazz

  • Advancing Circuit Reliability at TowerJazz with Calibre PERC Rule Decks Abstract

    SUITE SESSION TowerJazz, the global specialty foundry leader, is now providing Calibre PERC rule decks that enable their customers to perform circuit reliability verification during signoff. TowerJazz provides highly customized electrostatic discharge (ESD) and power management circuit checks based on their specific manufacturing processes. Many of these checks have been automated for the first time by taking advantage of the Calibre PERC product’s unique ability to combine schematic (net list) and physical layout information, which goes beyond the scope of traditional LVS, DRC and ERC tools. This is a one-time, limited seating session for advanced Calibre users. Tue 2:00, Mentor booth.

Prashant Varshney, Product Engineering Director, Mentor Graphics

  • Achieving Best PPA at Advanced Nodes using Olympus-SoC Abstract

    PARTNER KIOSK PRESENTATION One of the predominant P&R challenges is realizing best power, performance and area (PPA), a goal that is more difficult to achieve at advanced nodes due to complex DRC / DFM rules, double patterning, growing design sizes, low power requirements and increasing process and design variations. It is also critical to reduce the die size to justify the cost of moving to smaller nodes. This session shows advanced technologies for efficient design closure such as concurrent PPA optimization, pseudo flat flow methodology and DRC/DP signoff during implementation. Tue 2:05 in the GLOBALFOUNDRIES booth.

Randy Grover, Director, Product Development, Digital Convergence Group, ST Microelectronics

  • Physical Design Flow Experience and Silicon Successes Using Olympus-SoC Abstract

    SUITE SESSION In this session STMicroelectronics will be sharing their experience and successes in using Olympus-SoC on their designs. They will be specifically covering the key backend design challenges and how Olympus was effectively used for timing and design closure including MCMM based timing, and area optimization for their designs. Results and comparisons from case studies will be presented in the session

Richard Trihy, Director Design Methodology, GLOBALFOUNDRIES

  • Panel: No Fear of FinFET Abstract

    SUITE PANEL FinFETs, or so-called 3D transistors, are a key competitive element in all the leading edge IC foundry offerings because FinFETs can achieve much lower power operation than planar transistors. There has been a lot of discussion of the physical and electrical characteristics of FinFETs, but designers are wondering how FinFETs will change the design, verification and test flow. This show floor panel will provide a forum for experts and DAC attendees to learn and interact directly in an informal and entertaining discussion. The panel will be immediately followed by a hosted bar happy hour.

Robert Patti, CTO and VP of Design Engineering, Tezzaron

  • Panel: Marrying More Than Moore Abstract

    SUITE PANEL The IC industry will undergo significant changes as future growth is driven not just by traditional Moore’s Law scaling, but also by “More Than Moore” technologies including 3D-IC, MEMS and silicon photonics. As these technologies emerge from R&D into volume production, they will create new opportunities for IC designers to add value to products. They will also challenge designers to find a way to combine the strengths of these technologies and to marry them into a unified EDA flow. This panel will be an interactive forum where attendees on the exhibition floor can exchange ideas and questions with a group of experts who are already grappling with these exciting opportunities and challenges. The panel will be immediately followed by a hosted bar happy hour.

Stephen Pateras, Product Marketing Director, Mentor Graphics

  • DFT and Test for Safety Critical Applications Abstract

    SUITE SESSION ISO 26262 is emerging as a standard that’s being rapidly adopted by the automotive industry. This standard specifies objectives that must be met in the development of safety critical automotive electronics systems. This standard is already starting to push new requirements down to the semiconductor suppliers for these automotive subsystems. This is creating an opportunity for automotive semiconductor suppliers to differentiate themselves based on their test strategy, which can make their offering more appealing for ISO 26262 mandated systems. This session will focus on features and solutions within Mentor Graphics’ Tessent silicon test and yield analysis products that can be leveraged for designs destined for an ISO 26262 application.

Suk Lee, Senior Director Design Infrastructure Marketing Division, TSMC

  • Panel: Marrying More Than Moore Abstract

    SUITE PANEL The IC industry will undergo significant changes as future growth is driven not just by traditional Moore’s Law scaling, but also by “More Than Moore” technologies including 3D-IC, MEMS and silicon photonics. As these technologies emerge from R&D into volume production, they will create new opportunities for IC designers to add value to products. They will also challenge designers to find a way to combine the strengths of these technologies and to marry them into a unified EDA flow. This panel will be an interactive forum where attendees on the exhibition floor can exchange ideas and questions with a group of experts who are already grappling with these exciting opportunities and challenges. The panel will be immediately followed by a hosted bar happy hour.

Tim Turner, Reliability Center Business Development Manager, College of Nanoscale Science and Engineering, University at Albany, NY

  • Panel: Achieving IC Reliability in High Growth Markets Abstract

    SUITE PANEL Several high growth IC markets are experiencing demand for higher reliability, including mobile/wireless, automotive, industrial control and medical. At the same time, factors such as thinner gate oxide and multiple power rails have the potential to introduce subtle design flaws leading to delayed failure mechanisms. This panel will be an interactive forum where experts and attendees on the show floor can discuss the demand for IC reliability, what design methodologies can reduce the occurrence of delayed failure mechanisms, and how design for reliability checks can be automated to help remove the burden from designers. The panel will be immediately followed by a hosted bar happy hour.

Yi-Kan Cheng, Deputy Director of the Design Methodology & Kit Development Division, TSMC

  • Best Practices for 20nm Design Abstract

    SUITE SESSION When leading edge customers first transitioned to 20nm they encountered issues not experienced in prior nodes with the set-up of hardware, flows, and use models during chip verification. TSMC and Mentor worked with these customers to resolve the issues resulting in successful tape-outs of these customers’ designs. TSMC and Mentor will present best practices learned from that experience to help other customers smoothly tape-out their advanced process node designs. Mon 2:00, Mentor booth.

Design & Functional Verification

Ellie Burns, Product Manager, Design and Verification Technology Division, Mentor Graphics

  • Maximize Verification Cycles with Questa Abstract

    SUITE SESSION How can you verify twice as much as the last project, in the same amount of time, using the same amount of resource and the same team? This session will focus on what’s new in all areas of the Questa Platform (performance, debug, TB/stimulus creation, coverage closure, low power, SoC verification), and how the platform unifies and automates tools, engines, and methodology into adoptable solutions so that 1+1=3.

Jim Kenney, Marketing Director, Emulation Division, Mentor Graphics

  • System Level Power Verification and Analysis with Veloce Abstract

    SUITE SESSION The Veloce hardware emulation system tackles the two primary aspects of power during system-level verification. Power aware verification ensures that power management logic and software control were implemented correctly and that the power functionality of the design is correct. Power analysis identifies activity peaks and drives data to 3rd party power estimation tools. In this session, we will look at both aspects of designing for power and discuss how they can be used independently or collectively for system-level verification.

Jon McDonald, Sr. Technical Marketing Engineer, Mentor Graphics

  • HW and SW Design Demands Parallel Development Abstract

    SUITE SESSION Complexities and quality requirements of FPGA and ASIC designs today are demanding new design approaches that start with creation. The level of design abstraction must now be raised above RTL in order to contribute an entire new dimension of benefits to design, especially for multi-core architectures. Raising the design description language up from RTL to electronic system level (ESL), which is TLM-based (transaction level modeling), enables more design to designed, explored, validated, and co-designed with corresponding software and firmware using virtual prototypes to result in faster design cycles, higher quality projects, and higher levels of hardware and software design assurance.

Roger Do, Sr. Technical Marketing Engineer, Mentor Graphics

  • Maximize Your FPGA Design Effort Abstract

    SUITE SESSION Today, FPGA design is not just writing HDL code, but getting the design to meet design goals and validating the complex functionality that has been implemented. There is no substitute for good coding style, but it’s not enough to get the best performance or area utilization results. Expert knowledge of the design tools is invaluable for maximizing results, but who has time to become a tool expert? Once the design goals are met and the FPGA is on the board, does it function as intended? Considerable time is being spent in the "lab" analyzing why a design does not work correctly. In this presentation, new technologies will be showcased in design exploration and validation. Tools should automatically help you get the best results, and rule out or find where possible errors can be introduced in your design between the HDL code and the actual physical implementation on the board. Learn how Mentor Graphics has automated design exploration and design validation processes to maximize your FPGA design effort.

Roger Sabbagh, Product Marketing Manager, Mentor Graphics

  • Verification:  Automate When Possible Abstract

    SUITE SESSION In the world of ever increasing verification complexity, is anything getting any easier? For some good news on this front, join us for this session where we will examine solutions which add automation to the verification process. Focus areas include: reset and X-state propagation, enhanced coverage through automatic property generation, handling the convergence of multiple clock and power domains, and more!

Steve Bailey, Director of Emerging Technologies, Mentor Graphics

  • Functional Verification of ARM-based subsystems and SoCs with Questa

Subba Somanchi, Director of the System Modeling & Analysis, Mentor Graphics

  • Model-Driven Systems Design: Concept to Implementation & Test Abstract

    SUITE SESSION This presentation will show how Model Driven Development can address common challenges in the system design, verification & testing of complex systems and systems of systems. Project success requires that hardware, software and test teams fluently integrate application software, controlling firmware, analog and digital hardware, and mechanical components. Successfully integrating and verifying such a complex multi-disciplinary system often proves to be costly in terms of time, money, and engineering resources. This presentation covers the Model Driven Development of a virtual prototype that supports system engineering teams along with software, digital hardware, analog hardware, system interconnect algorithm development, hardware / software co-simulation and virtual system integration using a tools flow emphasizing requirements tracing, UML system modeling, and linking to functional FPGA, IC and PCB domains.

Valerie Rachko, Director of Marketing, HDL & ESL Design Creation in the Design Creation BU, Embedded Systems Division, Mentor Graphics

  • FPGA Design from Concept to Implementation to Safety/Mission/Security Success Abstract

    SUITE SESSION The design regulations for FPGAs and ASICs in commercial and military aircraft are some of the strictest to adhere to and for good reason – failure of electronics in commercial aircraft can have catastrophic results. While the commercial air industry has mandated the DO-254 hardware design standard, military aerospace companies are adopting design processes similar to DO-254, some even having their own auditors. By taking a design approach that is requirements-driven and well integrated for FPGA and ASIC design creation through device implementation, an excellent design process can be followed that will enable meeting the compliance needs of DO-254 and other such regulations, while also improving the project’s efficiency, productivity, predictability and final chip quality. This session will present advanced chip design methods and practices that are now essential for any mil/aero FPGA or ASIC design project.

Verification Academy

Abhishek Ranjan, Senior Director of Engineering, Calypto

  • Optimizing for Power Efficient Design Abstract

    SUITE SESSION With the explosion of portable electronic devices, designing for low-power is a critical design constraint. The RTL design phase provides the ideal opportunity to dramatically reduce power, since several micro-architectural transformations can be done at this stage, via automated tools or manually. This session will review how Power Analysis can be done at the RTL level to drive low power optimizations.

Cliff Cummings, President, Sunburst Design

  • The New SystemVerilog 2012 Standard Abstract

    SUITE SESSION SystemVerilog is the mainstay of modern design and verification. Many new language features have been added in the 2012 standard to promote more efficient design and improve verification. Get an update on new features like multiple class interface inheritance, soft constraints, complex coverpoint bin expressions, new discrete real modeling and more!

Dennis Brophy, Director, Strategic Business Development, Mentor Graphics

  • The New SystemVerilog 2012 Standard Abstract

    SUITE SESSION SystemVerilog is the mainstay of modern design and verification. Many new language features have been added in the 2012 standard to promote more efficient design and improve verification. Get an update on new features like multiple class interface inheritance, soft constraints, complex coverpoint bin expressions, new discrete real modeling and more!

Ellie Burns, Product Manager, Design and Verification Technology Division, Mentor Graphics

  • UPF-Based Verification for Cypress PSOC Abstract

    SUITE SESSION For Cypress PSOC devices, the lowest possible power consumption with very short design cycles is critical. Validating the power management (multiple power domains, power up/down of individual blocks) early in the design cycle is key. This session describes the Cypress UPF-based methodology using Questa PASim that helped find and debug power bugs at RTL that would have been disastrous late in the design cycle.

Erich Marschner, Vice-chair of the IEEE P1801 UPF Working Group and Verification Architect, Mentor Graphics

  • IEEE 1801 UPF Commands and Methodology Abstract

    SUITE SESSION Power has become a critical design constraint for today’s electronic systems. IEEE 1801 Unified Power Format (UPF) enables specification of power intent to drive both verification and implementation of electronic systems. This session introduces UPF concepts and commands for defining the power management architecture of a system and presents methodology for incorporating power intent into IP and systems design.

Galen Blake, Lead Verification Architect, Altera

  • Bus Fabrics: Make Sure You’re Covered Abstract

    SUITE SESSION Bus fabrics can no longer be ignored during SoC verification, as they can cause designs to fall short of functional and performance requirements. Intelligent testing automates bus fabric verification by generating bus traffic that covers all corner case interactions at speed. Learn how Altera used intelligent testing to verify a complex AMBA bus fabric, achieving first silicon success while saving months of time.

Harry Foster, Chief Verification Scientist, Mentor Graphics

  • Verification Today and Tomorrow Abstract

    SUITE SESSION Every two years, Mentor Graphics commissions Wilson Research Group conducts a broad, vendor-independent survey of design verification practices around the world. This presentation reveals the results of this just-completed study—and the observed convergence of SoC design practices toward a common methodology.

Jim Kenney, Marketing Director, Emulation Division, Mentor Graphics

  • System Level Power Emulation Abstract

    SUITE SESSION Hardware emulation systems tackle the two primary aspects of power during system-level verification. Power aware verification ensures that power management logic and software control were implemented correctly and that the power functionality of the design is correct. Power analysis identifies activity peaks and drives data to 3rd party power estimation tools. In this session, we will look at both aspects of designing for power and discuss how they can be used independently or collectively for system-level verification

John Biggs, Chair of the IEEE P1801 UPF Working Group and Consultant Engineer at ARM, ARM

  • IEEE 1801 UPF Commands and Methodology Abstract

    SUITE SESSION Power has become a critical design constraint for today’s electronic systems. IEEE 1801 Unified Power Format (UPF) enables specification of power intent to drive both verification and implementation of electronic systems. This session introduces UPF concepts and commands for defining the power management architecture of a system and presents methodology for incorporating power intent into IP and systems design.

Mark Olen, Functional Verification Technologist, Mentor Graphics

  • Intelligent Tests: Don’t be Constrained Abstract

    SUITE SESSION Intelligent verification has proven to achieve coverage goals 10X faster than constrained random testing, but what if you’ve already written a SystemVerilog testbench? Learn how the latest advances in intelligent testing can now re-use existing constraints and coverage models to achieve coverage 10X faster. Also learn how intelligent testing can generate embedded test programs to verify your SoC at the system level.

Ram Narayan, Consulting Member of Technical Staff, Oracle Labs

  • Formal Applications Boost Verification Abstract

    SUITE SESSION Formal based technologies are used at Oracle to supplement simulation and boost the efficacy and efficiency of the verification process. Join us for this session as we examine some pragmatic applications of formal verification and the impact the results have had at Oracle on project quality and schedule.

Steve Bailey, Director of Emerging Technologies, Mentor Graphics

  • Holistic ARM Based SoC Verification Abstract

    SUITE SESSION Ensuring correct functionality of a SoC requires a holistic approach. Through comprehensive easy-to-use verification components, automated & intelligent test solutions, and high performance verification engines, this session will walk you through the critical steps needed for your SoC; interconnect subsystem, processor subsystem, to peripherals and special function accelerator blocks.

Tim Jordan, Senior Technical Staff Engineer, MicroChip Technology

  • Low Power Verification Abstract

    SUITE SESSION Microchip has been doing low power verification with UPF and Questa PASim for several years. Their devices contain multiple power domains, a substantial amount of analog circuitry and different behaviors whether “in the wall” or “on battery” and with different voltage levels: all must be verified. This sessions describes their low power challenges, methodology, and flow from RTL to GLS.

Tom Fitzpatrick, Verification Technologist, Mentor Graphics

  • UVM: Out of Committee Into Productivity Abstract

    SUITE SESSION This session will look at proven applications of UVM to move you from the conceptual to the practical. We will explore how UVM provides the ideal infrastructure for adopting new techniques, tools and technologies to improve your verification effectiveness. In addition, we will show how the advanced technologies in Questa use UVM to expand your verification capabilities in ways you may not have even thought of.

Vigyan Singhal, President and CEO, Oski Technology

  • Formal Verification: Myths and Facts Abstract

    SUITE SESSION Formal property checking increases design quality and shrinks project schedules. However, when it comes time to develop your verification plan, it can be difficult to separate formal verification fact from fiction. In this session, we examine some of the common misconceptions about formal verification that interfere with its successful use. We’ll debunk these myths and show you how to use strategies that work!

AMS/Custom IC Design

Ahmed Eisawy, Product Marketing Manager, Mentor Graphics

  • Introducing Kronos Standard Cell Characterization and Analysis Abstract

    SUITE SESSION Explore how the Kronos integrated platform for cell library characterization of standard cell, IO pad and complex cells reduces characterization time enabling complex flip-flops that would normally take 30 minutes to complete on a single machine in as little as one minute. Discuss how Kronos Analyzer can compare library correctness and automatically find cell maps between libraries based on cell behavior.

Linda Fosler, Director of Marketing, Mentor Graphics

  • Custom IC Design and AMS Verification – Unparalleled Insight and Productivity Abstract

    SUITE SESSION From our complete Custom IC Design flow through our industry leading simulators and analog Mixed Signal verification systems, Mentor Graphics solutions provide insight and productivity. This session will provide a quick overview of what is new across the product portfolio and then focus on the most recent customer results from our industry leading Faster SPICE simulator, Eldo Premier. Join us and learn about our new Electro-Thermal analysis features and how customers are gaining up to 12X performance improvement over traditional SPICE simulation.

Mitch Heins, Channel Marketing Manager, Mentor Graphics

  • Pyxis Open – The New Era in Custom Design – Automating the CORE Abstract

    SUITE SESSION Mentor Graphics is bringing revolutionary insight and automation to the most manual portions of custom IC design – the core – routing, placement and floor planning. Hear how our revolutionary interactive custom router is changing the competitive game for its users as it shortens routing time by 10X’s and cuts weeks of our customer’s tape out schedules. Also enjoy a sneak preview of our next deliveries for the automation core.

Tom Daspit, Product Marketing Manager, Mentor Graphics

  • Pyxis Open – The New Era in Custom Design – Automating the CORE Abstract

    SUITE SESSION Mentor Graphics is bringing revolutionary insight and automation to the most manual portions of custom IC design – the core – routing, placement and floor planning. Hear how our revolutionary interactive custom router is changing the competitive game for its users as it shortens routing time by 10X’s and cuts weeks of our customer’s tape out schedules. Also enjoy a sneak preview of our next deliveries for the automation core.

Embedded Software

Jamie Little, Alliance Marketing Manager, Embedded Software, Mentor Graphics

  • ARM Connected Community & Mentor Embedded