TECHNICAL SESSION There has been a remarkable emergence of new advanced verification techniques, methodologies, languages and new standards in the past ten years. And, recent industry studies have indicated a rapid acceleration in their adoption. This is true across all types of IC design and geographic regions. Designers and verification engineers are surprisingly open to new approaches to keep pace with the relentless rise in design density.
Yet, for many projects, the process of evolving their functional verification capabilities presents a paradox. That is, some projects are unable to quantify the effectiveness of these new processes they put in place—or identify opportunities for process improvement—due to the lack of process measurements. As the saying goes, if you can’t measure it, you can’t improve it.
This presentation discusses techniques for evolving SoC functional verification capabilities, from paradox to paradise, with the introduction of metrics-driven processes. A full set of solutions for managing, analyzing, and automating metrics-driven processes will be described.