DFT: Yield Assist Advanced Diagnostics
- Add Courses
- Confirm Schedule
- Enter Contact Information
There are currently no dates scheduled for this class. Request this class in your area!
Duration: 1 Day
Pricing: 740 EUR
Course Part Number: 236095
Description
YieldAssist(R) Advanced Diagnostics will teach you to capitalize on the methods of defect discovery on failing devices in a production environment. Using the defect reports from YieldAssist you will be able to plan the analysis process in determining the root cause of failure, reducing time and improving your hit rate. With the correlation between the 'Logical netlist' and the Physical layout you will have a indication of the most likely area where to begin the failure analysis.
Hands-on lab exercises will reinforce lecture and discussion topics all under the guidance of our industry expert instructors. You will be presented with many typical testing challenges as observed on the production floor and with the processes needed to facilitate the production flow for high performance testing requirements.
You will learn how to
- Prepare TestKompress & FastScan data for YieldAssist
- Prepare failure data from Automatic Test Equipment for Diagnostics
- Run YieldAssist
- Interpret diagnostics reports to determine the failure mode of the defect
- Link reported symptoms to clusters in physical layout view
- Prepare diagnostics to use ‘Layout Marker’ notation
- Create enhanced patterns to enhance diagnostic resolution
- Prepare the automated diagnosis server to perform production volume diagnostics
Hands-on Lab Exercises
Throughout this course, extensive hands-on lab exercises provide you with practical experience in using to report suspects from failing circuit responses. Hands-on lab topics include:- Design-For-Test pattern generation to demonstrate the basic setup and data used by YieldAssist
- Examine reports from failing devices showing different failure modes
- Use YieldAssist to create enhanced patterns to increase the resolution of suspects
- Use reported suspects from YieldAssist and Calibre RVE to identify nodes in layout
- Setup the automated diagnosis server to evaluate several fail logs for volume diagnostics
Audience
- Failure Analysis engineers who determine root cause issue of failing devices which are the YieldLimiters
- Product engineers & managers requiring volume data to determine YieldLimiters
- Design-For-Test engineers who create test patterns for production test
- Production Test engineers who create prepare DFT patterns and develop the ATE test program
Prerequisites
- The student should have basic knowledge of Verilog and Unix operating system prior to attending this course
- Optionally a Introduction to Design-for-Test is advisable but not required