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PCB Manufacturing, Assembly & Test Blog

Posts tagged with 'data preparation'

28 Aug, 2012

Mark Laing Hi there Although the Valor MSS Process Preparation solution can handle most types of data that are passed it’s way, intelligent design data brings a wealth of benefits to its users. The import process is typically a few seconds for most designs as opposed to multiple hours to reverse engineer Gerber files to a sufficient level to be useful for manufacturing. Having to support electrical test … Read More

ODB++, bill of materials, documentation, programming, Gerber, BOM, VPL, data preparation, vPlan

15 Aug, 2012

Mark Laing Hi there For the many years I have worked in this industry one of the most common complaints from SMT engineers is related to position and rotation errors that were found during the first article inspection of a PCB during the sticky tape run. The programs would then be tweaked and the sticky tape board ran again to confirm the changes. This resulted in a significant loss of line down time while the … Read More

programming, data preparation, virtual sticky tape, pick and place, vPlan, mixed vendor

7 Aug, 2012

Mark Laing Hi there I have covered a number of areas of process engineering in this blog over the past few months and there is now an opportunity to see how these areas all come together next week in our Webinar titled “World Class Process Preparation”. We will be discussing a number of ways that the users of Valor MSS can streamline their process preparation tasks to make them more efficient and reduce … Read More

Planning, AOI, mixed vendor, BOM, data preparation, documentation, AVL, Flying Probe, bill of materials, ICT, Design For Test, process preparation, vPlan, Webinar, testability, stencil, programming, Sequence

31 Jul, 2012

Mark Laing Hi there This week sees the all new Valor MSS 11.2 version that supports all areas of PCB Process Engineering and Shop Floor. One of the new features of this release is the ability to include Automated Optical Inspection (AOI) machines in-line with the SMT placement machines. This provides the ability to create specific AOI programs depending on where the machine is in the line relative to the point … Read More

data preparation, approved vendor list, vPlan, AOI, BOM, process, AVL, programming, bill of materials

17 Jul, 2012

Mark Laing Hi there One of the least efficient areas in PCB assembly concerns the creation and management of package data that will be consumed across the shop-floor. For example DFM processes rely on accurate package data to determine component to component spacing issues or using accurate pin terminus contact data to ensure that solder joints will form correctly. Accurate package data is critical for DFT analysis … Read More

programming, AOI, bill of materials, mixed vendor, process, data preparation, documentation, Design For Test, Flying Probe, ICT, BOM, VPL, vPlan, stencil, testability

10 Jul, 2012

Mark Laing Hi there Within the Valor MSS Process Preparation suite, we have the best DFA capability that exists in the market. There are a number of checks that are performed that are necessary for PCB assemblers to execute prior to starting a design in production. Being able to know if fiducials on the board are near similar pads or vias is important to ensure that placement and inspection equipment don’t … Read More

Flying Probe, bill of materials, testability, vPlan, ICT, Design For Test, BOM, data preparation

3 Jul, 2012

Mark Laing Hi there One of the largest groups of users within Valor MSS Process Preparation for SMT programming is those supporting ASM, formerly Siemens, pick and place machines. ASM has released their OIB interface as a single API for both programming and monitoring for external applications to use. This has the benefit for third party applications to have an open interface that can be programmed to consistently … Read More

process, programming, data preparation, ASM, SIPLACE, OIB, vPlan, mixed vendor

27 Jun, 2012

Mark Laing Hi there Spreadsheets are probably one of the most useful applications for computers. They were also the “killer app” that allowed computers to take off to the masses. So we have relied more and more on them for every day tasks. One area they are playing a role is in the prioritization of production work orders. It is not uncommon to have to determine which of hundreds of work orders each … Read More

process, Sequence, bill of materials, Planning, vPlan, BOM, data preparation

19 Jun, 2012

Testability versus Accessability

Posted by Mark Laing

Mark Laing Hi there Test Engineers are typically given the requirement to get 100% of nets probed at electrical test with the thinking that this delivers 100% testability. Unfortunately 100% accessibility is not the same as 100% testability. There are a number of reasons why this is not the case but here is a easy one. Typical boards contain integrated circuit (IC) components and power supplies. These power supplies … Read More

programming, data preparation, Design For Test, ICT, testability, Flying Probe

12 Jun, 2012

Mark Laing Hi there When providing accurate Design For Test (DFT) feedback to board designers, individual targets are usually inaccessible for a number of reasons. However, most DFT products only report the first reason a target is inaccessible. So this limited feedback is provided to the designer who corrects that single problem, only to find that when the analysis is run again on the new layout another reason … Read More

data preparation, Flying Probe, programming, ICT, Design For Test, vPlan

6 Jun, 2012

Hot and humid in Israel

Posted by Mark Laing

Mark Laing Dear all It has been a few months but this week I am out at the Mentor Graphics office in Yavne, Israel. I have been working with the R&D team out here on the upcoming versions of our Process Engineering solutions. I certainly appreciate people taking the time to respond to my blog last week on stencil apertures. The new area ratio report as discussed in last week’s blog will be part of the … Read More

Enhancement, documentation, Flying Probe, VPL, vPlan, programming, BOM, AOI, stencil, data preparation, Design For Test, Planning

29 May, 2012

Mark Laing We have recently received a number of requests from customers to add the Valor DFA capability to their existing process engineering solutions which were not Valor products. We now have a way to enable the addition of the Valor DFA solution that will work in conjunction with your existing SMT Programming or Documentation Creation solutions. This enables the fast adoption of DFA analysis capability without … Read More

programming, data preparation, documentation

22 May, 2012

Mark Laing Dear all I am requesting your input on a hot topic within the Valor Process Engineering team this week. Namely how to calculate the aspect ratio and area ratio for stencil apertures. Now from my research so far, the most common measure of whether the aperture will release correctly has typically been the aspect ratio, however this seems to be calculated easily in simple cases of rectangles and circles. … Read More

stencil, data preparation, aperture

15 May, 2012

Mark Laing A lot of engineers take advantage of the software capability that is delivered with the various types of assembly, test and inspection equipment. However, there is a false economy here as these software applications are optimized for that machine, meaning they typically have very good support for programming the machine but do a less than ideal job of handling the challenges of different CAD/CAM/BOM … Read More

bill of materials, AOI, Flying Probe, programming, ICT, BOM, data preparation

10 Apr, 2012

Mark Laing The AOI inspection library names are an important part of AOI programming as the reuse of these inspection templates can speed up the debug programming time, which can in turn improve line utilization time. Within Valor MSS Process Preparation the Master Part Library can store custom attributes that provide the ability to map each part number to an inspection template name. This could be a single attribute … Read More

data preparation, AOI, programming, test, inspection, optical

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