ATPG & Compression

Automatic Test Pattern Generation

  • Automatically generates patterns for testing manufactured devices
  • Supports at-speed testing to ensure high quality test for designs at 130nm and below
  • Provides high test coverage and rapid performance
  • Features diagnostics capabilities to facilitate failure analysis

Test Compression

  • Addresses the substantial increase in test pattern volume
  • Reduces test time and data volume by up to 100X
  • Improves test quality and cost
  • Supports all features and functionality of an ATPG methodology
  • Integrates easily into any design flow
Paving the Way to 1000x Compression

A new feature added to TestKompress 2007_4 release enhances test pattern compression, resulting in an average decrease of test data volume and time by 30-40%. Xpress is the next generation of compactor methodology. It handles X states more effectively, reducing the number of patterns that have to be truncated and eliminating the potential for having to do an ATE reload during a test run.

Mentor Technology ViewpointTest Compression and Low Pin Count Test

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