ATPG & Compression


Automatic Test Pattern Generation

  • Automatically generates patterns for testing manufactured devices
  • Supports at-speed testing to ensure high quality test for designs at 130nm and below
  • Provides high test coverage and rapid performance
  • Features diagnostics capabilities to facilitate failure analysis

Test Compression

  • Addresses the substantial increase in test pattern volume
  • Reduces test time and data volume by up to 100X
  • Improves test quality and cost
  • Supports all features and functionality of an ATPG methodology
  •  Integrates easily into any design flow
Paving the Way to 1000x Compression

A new feature added to TestKompress 2007_4 release enhances test pattern compression, resulting in an average decrease of test data volume and time by 30-40%. Xpress is the next generation of compactor methodology. It handles X states more effectively, reducing the number of patterns that have to be truncated and eliminating the potential for having to do an ATE reload during a test run.

Products

  • TestKompress

    Embedded deterministic test tool, proven to provide up to 100X compression for improved test quality and cost.

  • FastScan

    ATPG tool featuring at-speed test, diagnostics, and MacroTest for testing small, embedded blocks.

  • DFTAdvisor

    Testability analysis and test synthesis tool.

  • FlexTest

    Fault simulation tool for functional vectors and ATPG for unstructured designs.
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