FastScan

• Market leading automatic test pattern generation (ATPG) tool
• Advanced at-speed test capabilities for defect detection
• Innovative compression techniques to generate compact test sets
• Extensive fault model support, including stuck-at, IDDQ, transition and path delay
• On-chip PLL support for accurate at-speed test
• Comprehensive design rules checking to identify testability problems early

FastScan has lead the industry, setting the standard for ATPG products for more than a decade.  Read more about FastScan and the ATPG Product Family in the Datasheet Now.

• Highest performance ATPG for full scan designs
• Easily integrated into any standard design flow
• Works with the Mentor Graphics DFT tool suite to ensure automated, whole chip test
• Ensures high quality test for nanometer designs