TestKompress

TestKompress - ATPG with Embedded Compression.  TestKompress enables semiconductor manufacturers to improve test quality while reducing test costs. Read more now in the Datasheet.

 
Paving the Way to 1000x Compression

A new feature added to TestKompress 2007_4 release enhances test pattern compression, resulting in an average decrease of test data volume and time by 30-40%. Xpress is the next generation of compactor methodology. It handles X states more effectively, reducing the number of patterns that have to be truncated and eliminating the potential for having to do an ATE reload during a test run.

 

Features

  • Employs patented Embedded Deterministic Test (EDT™) technology
  • Provides up to a 100X reduction in test data volume and test time
  • Supports all ATPG fault models and pattern types, including stuck-at, IDDQ, transition and path-delay for at-speed test
  • Diagnoses failures directly from compressed data
  • Fits into any scan-based design flow
  • Utilizes FastScan’s command set and design rule checks (DRCs)

Benefits

  • Ensures high test coverage via deterministic pattern generation
  • Enables testing of additional fault types and eliminates the need for pattern truncation
  • Reduces scan test time up to 100X, increasing production throughput
  • Reduces scan test data volume up to 100X, requiring less tester memory
  • Supports all design sizes and types. No special handling for embedded blocks, memories, or non-scan cells is required
  • Uses scan/ATPG methodology. Fully compatible with industry design flows and Mentor’s entire suite of DFT product
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