Using FastScan: Design-for-Test Demo

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Overview

At-Speed transition and path delay scan testing requirements are rapidly increasing to improve the quality of test and to detect the growing population of timing-related defects in 0.13 micron and smaller technologies.

This demo will show you how FastScan is used for at-speed testing and highlights the features of FastScan that enable more efficient and controlled at-speed test.

Approximate length: 10 minutes