TestKompress Xpress Compactor - Part 1

Online Event Registration

Click Here to Register and View Today!

Overview

Hear from Mentor's Chief Scientist and Directory of Enginnering, Janusz Rajski, Ph.D., on technology now available in TestKompress. This presentation presents a two-stage test response compactor with scan chain selection logic. See how Mentor's solution is capable of handling a wide range of X state profiles, offers compaction much higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution.

Length: 12 minutes