TestKompress Xpress Compactor - Part 1
Online Event RegistrationClick Here to Register and View Today!OverviewHear from Mentor's Chief Scientist and Directory of Enginnering, Janusz Rajski, Ph.D., on technology now available in TestKompress. This presentation presents a two-stage test response compactor with scan chain selection logic. See how Mentor's solution is capable of handling a wide range of X state profiles, offers compaction much higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution. Length: 12 minutes |