IEEE Conference Papers | 2003

2003 Conference Papers:

Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault, Yu Huang, Wu-Tung Cheng, Mentor Graphics Corporation, Sudhakar M. Reddy, University of Iowa, Cheng-Ju Hsieh, Yu-Ting Hung, Faraday Technology Corporation

Convolutional Compaction of Test Responses, Janusz Rajski, Chen Wang, Mentor Graphics Corporation, Jerzy Tyszer, Pozan University of Technology, Sudhakar M. Reddy, University of Iowa ECE Department

Impact of Multiple-Detect Test Patterns on Product Quality, Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy LSI Logic Corporation, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski, Mentor Graphics Corporation