IEEE Conference Papers | 2004
ITC 2004 Conference Papers:
ATE Data Collection - A Comprehensive Requirements Proposal to Maximize ROI of Test
M. Rehani, R. Madge, J. Teisher, LSI Logic; D.Abercrombie, Mentor Graphics; J. Saw, InvantestRealizing High Test Quality Goals with Smart Test Resource Usage
X. Gu, C. Wang, A. Lee, B. Eklow, Cisco Systems; K. Tsai, J. Tofte, M. Kassab, J. Rajski, Mentor GraphicsHierarchical DFT Methodology: A Case Study
J. Remmers, Plexus Design Solutions; R.Fisette, Mentor Graphics