LBISTArchitect

• Complete solution for applications requiring a vectorless test approach, such as in-system test
• • Analyzes a design’s testability
  • Synthesizes test structures into the design
  • Simulates the design’s fault coverage
  • Generates reference signatures
• Patented MTPI test point insertion algorithms
• Comprehensive BIST-Ready capabilities
• Graphical display of DRC violations

Benefits

• Very high fault coverage maximizes product quality and minimizes field returns
• Improved test quality with at-speed BIST
• Supports hierarchical BIST in conjunction with BSDArchitect
• Completely compatible with FastScan ATPG — identical libraries, fault classifications, and simulation engines