LBISTArchitect
- Complete solution for applications requiring a vectorless test approach, such as in-system test
- Analyzes a design’s testability
- Synthesizes test structures into the design
- Simulates the design’s fault coverage
- Generates reference signatures
- Patented MTPI test point insertion algorithms
- Comprehensive BIST-Ready capabilities
- Graphical display of DRC violations
Benefits
- Very high fault coverage maximizes product quality and minimizes field returns
- Improved test quality with at-speed BIST
- Supports hierarchical BIST in conjunction with BSDArchitect
- Completely compatible with FastScan ATPG — identical libraries, fault classifications, and simulation engines
Design-For-Test Resources
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