Memory Test

• Tests a design's embedded memories
• Supports two-pronged approach for high test quality
  • Memory built-in self test (BIST) for large embedded memories
  • Automated scan-based solutions for small memory arrays

Products

MBISTArchitect

• A comprehensive memory BIST generation tool, offering true at-speed application and BIST insertion, along with diagnostics and repair capabilities.

MacroTest

• A scan-based approach for non-intrusively testing small, embedded memory arrays.