- On-chip testing for embedded memories
- Generates and inserts BIST for a wide variety of embedded memory arrays
- Extensive test algorithms including capabilities to create custom algorithms
- True at-speed test for highest test quality
- Facilitates the diagnosis and repair process
- Creates a simulation testbench for verification
- Provides online algorithm selection
Benefits
- Delivers the fastest "at-speed" testing for efficient, high quality test
- Patented pipelining architecture enables application of at-speed test to memories that have operating speeds approaching 1GHz
- Enables customized algorithms for maximum flexibility and test coverage
- Offers comprehensive diagnostics for failure analysis
- Supports memory repair for yield improvement
- On-line algorithm selection enables users to choose which tests should be executed during manufacturing, allowing for balance between test time and increased coverage during production
|
