News & Industry Articles

June 2008

Mentor Graphics Outlines IC Implementation Strategy to Address Sub-45nm Challenges Jun 9, 2008

May 2008

Mentor Graphics Aligns Product Groups to Address IC Implementation Challenges at 45nm and Beyond May 7, 2008

Mentor Graphics Announces Partnership with NXP Semiconductors for Design-for-Test Tools and Technology May 6, 2008

October 2007

Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated Circuits Oct 1, 2007

May 2007

Mentor Graphics TestKompress leading ATPG tool to use SDQM to target delay defects May 9, 2007

November 2006

Faraday Adopts Mentor Graphics TestKompress; Cites Significant Reduction in Test Time and Data Volume Nov 13, 2006

October 2006

Mentor Graphics TestKompress 2007 Improves on Productivity, Performance, and Test Quality Oct 23, 2006

Mentor Graphics YieldAssist Supports Automated,Server-based Use Model for Rapid Yield Learning Oct 23, 2006

August 2006

Mentor Graphics to Deliver Select EDA Technologies To Freescale Semiconductor Aug 14, 2006

July 2006

Mentor DFT Tools Fully Support TSMC's Reference Flow 7.0 Jul 18, 2006

Mentor Graphics Design-for-Test Team Awarded IEEE CEDA Donald O. Pederson Best Paper Award Jul 12, 2006

June 2006

ATI Implements Mentor Graphics Modular TestKompress for Production Test of Advanced 90nm Graphics Processor Jun 20, 2006

January 2006

Mentor Graphics and STARC Partner to Develop Improved At-speed Test Methods for Nanometer Design Jan 24, 2006

October 2005

Mentor Graphics Expands DFM Strategy with YieldAssist Diagnostics Tool for Yield Improvement Oct 31, 2005

June 2005

Mentor Graphics TestKompress Supports TSMC Reference Flow 6.0 Jun 9, 2005

March 2005

Mentor Graphics Announces that UMC has Adopted the TestKompress Embedded Compression Solution for Manufacturing Test Mar 24, 2005

Tata Consultancy Services Selects Mentor Graphics Design-for-Test Tools Mar 2, 2005

October 2004

Mentor Graphics Announces Automated Functionality for Achieving Optimal Test Coverage Results in its FastScan and TestKompress Design-for-Test Tools Oct 5, 2004

Test Industry Expert Joins Mentor Graphics Oct 5, 2004

Mentor Graphics and Artisan Develop High Quality Embedded Memory Testing with Advanced BIST Architecture Oct 5, 2004

September 2004

Industry Articles Sep 13, 2004

March 2004

Motorola chooses TestKompress Mar 1, 2004

January 2004

Motorola Selects Mentor Graphics TestKompress and Calibre Products for High Quality Manufacturing Test and Technology Sign-Off Jan 28, 2004

FastScan receives Honorable Mention for Test & Measurement World Best in Test Award Jan 21, 2004

Ricoh Moves to a New Evolution in Test with TestKompress Jan 14, 2004

November 2003

President of Poland Honors Mentor Graphics Chief Scientist Nov 19, 2003

September 2003

Mentor Graphics Announces Improved Performance and Advanced At-Speed Capabilities in FastScan for Testing Nanometer Designs Sep 22, 2003

Procket Networks Standardizes on Mentor Graphics FastScan Sep 22, 2003

Mentor Graphics Announces AMD Adopting TestKompress for Manufacturing Test of Next-Generation Microprocessor Designs Sep 15, 2003

Industry Leaders Adopt Mentor Graphics TestKompress for Nanometer IC Design Sep 15, 2003

Mentor Graphics Announces Design-for-Test Support for AMD Opteron Processors and AMD64 Architecture Sep 11, 2003

June 2003

Mentor Graphics Provides TestKompress and Calibre Products for Infineon's Nanometer Design Flow Jun 2, 2003

December 2002

Goyatek Technology Standardized on Mentor Graphics Dec 18, 2002

September 2002

Mentor Graphics Announces Design-for-Test Support for Artisan Components' Flex-Repair™ Memories Sep 17, 2002

July 2002

Mentor Graphics Design-for-Test Tools Chosen by Faraday Jul 8, 2002

April 2002

Mentor Graphics Names Two New VPs Apr 19, 2002

Ricoh Adopts Mentor Graphics LBISTArchitect for Logic BIST Apr 17, 2002

Mentor Graphics Design-for-Test Tool Successfully Implemented On Arm Core Apr 3, 2002