Mentor Graphics Aligns Product Groups to Address IC Implementation Challenges at 45nm and Beyond May 7, 2008
Mentor Graphics Announces Partnership with NXP Semiconductors for Design-for-Test Tools and TechnologyMay 6, 2008
Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated CircuitsOct 1, 2007
Mentor Graphics TestKompress leading ATPG tool to use SDQM to target delay defects May 9, 2007
Faraday Adopts Mentor Graphics TestKompress; Cites Significant Reduction in Test Time and Data VolumeNov 13, 2006
Mentor Graphics TestKompress 2007 Improves on Productivity, Performance, and Test QualityOct 23, 2006
Mentor Graphics YieldAssist Supports Automated,Server-based Use Model for Rapid Yield LearningOct 23, 2006
Mentor Graphics to Deliver Select EDA Technologies To Freescale SemiconductorAug 14, 2006
Mentor DFT Tools Fully Support TSMC's Reference Flow 7.0Jul 18, 2006
Mentor Graphics Design-for-Test Team Awarded IEEE CEDA Donald O. Pederson Best Paper AwardJul 12, 2006
ATI Implements Mentor Graphics Modular TestKompress for Production Test of Advanced 90nm Graphics ProcessorJun 20, 2006
Mentor Graphics and STARC Partner to Develop Improved At-speed Test Methods for Nanometer DesignJan 24, 2006
Mentor Graphics Expands DFM Strategy with YieldAssist Diagnostics Tool for Yield ImprovementOct 31, 2005
Mentor Graphics TestKompress Supports TSMC Reference Flow 6.0 Jun 9, 2005
Mentor Graphics Announces that UMC has Adopted the TestKompress Embedded Compression Solution for Manufacturing TestMar 24, 2005
Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d" Mar 13, 2005
Tata Consultancy Services Selects Mentor Graphics Design-for-Test ToolsMar 2, 2005
Mentor Graphics Announces Automated Functionality for Achieving Optimal Test Coverage Results in its FastScan and TestKompress Design-for-Test ToolsOct 5, 2004
Test Industry Expert Joins Mentor GraphicsOct 5, 2004
Mentor Graphics and Artisan Develop High Quality Embedded Memory Testing with Advanced BIST ArchitectureOct 5, 2004
Motorola chooses TestKompressMar 1, 2004
Motorola Selects Mentor Graphics TestKompress and Calibre Products for High Quality Manufacturing Test and Technology Sign-OffJan 28, 2004
FastScan receives Honorable Mention for Test & Measurement World Best in Test AwardJan 21, 2004
Ricoh Moves to a New Evolution in Test with TestKompressJan 14, 2004
President of Poland Honors Mentor Graphics Chief ScientistNov 19, 2003
Mentor Graphics Announces Improved Performance and Advanced At-Speed Capabilities in FastScan for Testing Nanometer DesignsSep 22, 2003
Procket Networks Standardizes on Mentor Graphics FastScanSep 22, 2003
Mentor Graphics Announces AMD Adopting TestKompress for Manufacturing Test of Next-Generation Microprocessor DesignsSep 15, 2003
Industry Leaders Adopt Mentor Graphics TestKompress for Nanometer IC DesignSep 15, 2003
Mentor Graphics Announces Design-for-Test Support for AMD Opteron Processors and AMD64 ArchitectureSep 11, 2003
Mentor Graphics Provides TestKompress and Calibre Products for Infineon's Nanometer Design FlowJun 2, 2003
Goyatek Technology Standardized on Mentor GraphicsDec 18, 2002
Mentor Graphics Announces Design-for-Test Support for Artisan Components' Flex-Repair™ MemoriesSep 17, 2002
Mentor Graphics Design-for-Test Tools Chosen by FaradayJul 8, 2002
Mentor Graphics Names Two New VPsApr 19, 2002
Ricoh Adopts Mentor Graphics LBISTArchitect for Logic BISTApr 17, 2002
Mentor Graphics Design-for-Test Tool Successfully Implemented On Arm CoreApr 3, 2002
