Mentor Graphics Announces AMD Adopting TestKompress for Manufacturing Test of Next-Generation Microprocessor Designs

WILSONVILLE, Ore., September 15, 2003 - Mentor Graphics Corporation today announced Advanced Micro Devices, Inc. (AMD), a global supplier of integrated circuits for the personal and networked computer and communications markets, has adopted the Mentor Graphics? TestKompress? embedded deterministic test (EDT^TM) tool for high-quality manufacturing test of its upcoming microprocessor designs.  The TestKompress tool provides dramatic test compression of up to 100X reduction to improve the quantity and quality of test performed.

"Because design complexity is always increasing, we need to provide customers with intuitive, yet powerful solutions that enable them to meet their test and quality goals," said Robert Hum, vice president and general manager of the Design Verification and Test division for Mentor Graphics.  "Based on standard test methodologies and a leading ATPG tool, TestKompress offers customers such as AMD a logical evolution to their manufacturing test strategy."

"As additional testing plays a crucial role in the development of AMD's upcoming processors, it is important to have high test coverage and compression without interfering with the upcoming designs," said Ben Williams, director of AMD's Server/Workstation Business Segment. "With the TestKompress tool, AMD is even better armed to test upcoming products and help ensure that our products can exceed customer expectations."
The TestKompress tool can provide up to 100X reductions in test data volume and test time, enabling semiconductor manufacturers to increase the number of tests they perform while maintaining test coverage and even reducing test costs.  The TestKompress tool fits into any scan-based design flow and features the same functionality as FastScan^TM, Mentor's industry-leading automatic test pattern generation (ATPG) tool, including at-speed test capabilities and diagnostics to effectively test today's complex designs.  At-speed testing offers improved detection of speed-related defects that begin to appear at smaller process technologies, while the tool's patented compression capabilities reduce the amount of test data created by these additional tests. 

About Mentor Graphics Design-for-Test Tools
Mentor Graphics provides the industry's broadest portfolio of DFT solutions for today's System-on-Chip and deep submicron designs, including integrated solutions for scan, ATPG, EDT, advanced memory test, boundary scan, logic built-in self-test and a variety of DFT-related flows.  For more information visit www.mentor.com/products/dft.

About Mentor Graphics
Mentor Graphics Corporation (Nasdaq: MENT) is a world leader in electronic hardware and software design solutions, providing products, consulting services and award-winning support for the world's most successful electronics and semiconductor companies. Established in 1981, the company reported revenues over the last 12 months of about $650 million and employs approximately 3,500 people worldwide. Corporate headquarters are located at 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777; Silicon Valley headquarters are located at 1001 Ridder Park Drive, San Jose, California 95131-2314. World Wide Web site: www.mentor.com.

Mentor Graphics and TestKompress are registered trademarks and FastScan and EDT are trademarks of Mentor Graphics Corporation.  All other company or product names are the registered trademarks or trademarks of their respective owners.

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For more information, please contact:
Leanne White Mentor Graphics 503.685.1984 leanne_white@mentor.com	Suzanne Graham Mentor Graphics 503.685.7789 suzanne_graham@mentor.com