Industry Articles

2008

High quality scan test with minimal pins Adobe Acrobat Document Jul 30

As IC Designs Get blah, blah, blah . . . Adobe Acrobat Document Jul 07

Test is a Four Letter Word Adobe Acrobat Document May 05

DFT, ATE drive yield improvement  Feb 05

DFM-oriented test ensures better yield Adobe Acrobat Document Jan 16

2007

Designers Must Yield to Change  Nov 01

The X Factor Adobe Acrobat Document Oct 15

Embedded Compression For Production Test Adobe Acrobat Document Oct 01

Rethinking DFT Strategies in Nanometer Designs Adobe Acrobat Document Sep 03

The Many Faces of Software Diagnosis Adobe Acrobat Document Aug 15

Launch-off-shift at-speed test Adobe Acrobat Document Jun 07

Leverage on-chip blocks for better at-speed tests Adobe Acrobat Document Jun 04

2006

Reducing The Design Impact Of DFT In The Nanometer Era Adobe Acrobat Document Oct 26

Using Timing Constraints For Generating At-Speed Test Patterns Adobe Acrobat Document Oct 04

Test Compression - does compression need to be 100 times better Adobe Acrobat Document Oct 01

Choosing an IC Test Plan Adobe Acrobat Document Sep 08

Scan Diagnostics in the Nanometer Design Era Adobe Acrobat Document Apr 22

Easily Implement PLL Clock Switching for At-Speed Test  Apr 10

Taking Advantage of Scan for Yield Improvement  Feb 24

2005

Meeting yield enhancement challenges  Dec 01

Test diagnostic tool helps to increase yields Adobe Acrobat Document Oct 31

Test Takes New Role in Yield Improvement Adobe Acrobat Document Oct 17

Scan-Based Diagnostics Adobe Acrobat Document Oct 06

Physical Connection Adobe Acrobat Document Sep 15

Test Pattern Compression Saves Time and Bits Adobe Acrobat Document Jul 13

Evaluating test compression options  Jul 12

Adopting the Right Embedded Compression Solution Adobe Acrobat Document May 03

High Octane ATPG Adobe Acrobat Document May 01

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"  Feb 07

2004

Test experts ponder cost of defects  Nov 08

Defects driving IC test strategies  Oct 28

ITC keynoters say designers need IC yield data  Oct 27

ITC Speakers Address Yield Enhancement  Oct 27

Magma and Mentor Graphics Announce TestKompress Integration into RTL-to-GDSII Flow (issued by Magma)  Oct 25

Mentor, Magma Create RTL-to-GDSII Flow  Oct 25

Magma and Mentor Graphics Announce TestKompress Integration into RTL-to-GDSII Flow  Oct 25

BIST tool tackles embedded memories  Oct 08

Mentor, Artisan Cooperate on Memory BIST  Oct 07

Mentor Graphics and Artisan Develop High Quality Embedded Memory Testing with Advanced BIST Architecture  Oct 06

Mentor Graphics Announces Automated Functionality in FastScan and TestKompress DFT Tools  Oct 05

Mentor automates test tools, adds guru to staff  Oct 05

Good Bridge Testing Needed  Oct 04

Smart test for nanometer designs  Oct 01

Improving Manufacturing Test Quality; Multiple Detection for Higher... (German Publication) Adobe Acrobat Document Oct 01

Putting Memory to the Test in Nanometer Designs  Oct 01

At-speed Testing Made Easy Adobe Acrobat Document Sep 13

Enhancing Manufacturing Test and Yield in the Nanometer Era Adobe Acrobat Document Sep 13

At-speed Testing Made Easy Adobe Acrobat Document Jun 04

Enhancing manufacturing test and yield in the 90nm era Adobe Acrobat Document Jun 01

Predicting Yield using Test-Based Fault Localization Adobe Acrobat Document Apr 01

2003

Leading-Edge Diagnostic Tools Help Ramp Up SoC Production Adobe Acrobat Document Nov 10

Traveling at the speed of memory Adobe Acrobat Document Oct 24

Novel DFT schemes get real results  Oct 13

High-Frequency, At-Speed Scan Testing, Design & Test of Computers Adobe Acrobat Document Sep 02

DFT Circuit Designers Battle IC, PC-Board Complexities  Jun 16

Interview with Mentor Graphics Adobe Acrobat Document Jun 01

Improving Test Quality and Reducing Escapes Adobe Acrobat Document Apr 01

New methods test small memory arrays Adobe Acrobat Document Feb 03

2002

Yes, You Can Get A Testable SoC Design To Market On Time  Nov 25

On-time Finish Rests With Multiple Clocks  Apr 15

DFT Techniques for Total Test Quality Adobe Acrobat Document Jan 28

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