Mentor Graphics Design-for-Test Tools Chosen by Faraday
|
Wilsonville, OR, July 8, 2002 - - Mentor Graphics Corporation (Nasdaq: MENT) today announced that Faraday Technology Corporation has selected Mentor Graphicsow, Faraday also adopted the BSDArchitect tool for automated boundary scan implementation, the DFTAdvisor tool for scan synthesis and testability analysis and the DFTInsight tool for graphical DFT debug and analysis. We work on very aggressive development schedules with limited bandwidth, said Dr. George Huang, vice president of ASIC Technology for Faraday Technology. Mentor Graphics offers the DFT products we need to generate very high quality tests for our SoC designs in the least amount of time. Faraday was impressed with the MBISTArchitect tool's comprehensive array of memory BIST features designed to save chip area and achieve high fault coverage with minimal test time. Faraday can select from a set of pre-defined industry-standard algorithms, such as March C and checkerboard, or the tool's own MBIST Flex? user-definable algorithm which applies at-speed tests with flexible pattern applications to detect technology specific defects. The MBIST Full-Speed? feature, an at-speed BIST capability with pipelining techniques, significantly reduces test application times while the tool's comprehensive configurations facilitate high test set reusability. FastScan provides Faraday with leading ATPG technology, an intuitive interface and a range of fault models. The tool also offers advanced fault analysis techniques, comprehensive design rule checking, pattern compression and optimization capabilities, industry-proven at-speed test generation functionality and delivery of the highest coverage test sets for their ASIC and SoC designs. The breadth of Mentor DFT solutions offer customers such as Faraday a comprehensive test solution for today's most complex SoC devices, said Robert Hum, vice president and general manager, Model Technology group and Design-for-Test group, Mentor Graphics. Our leadership in the DFT industry ensures that as technologies evolve, Mentor will be ready with solutions that continue to improve test quality and reduce test costs. About Mentor Graphics Design-for-Test Tools About Mentor Graphics About Faraday Technology Corporation ### Mentor Graphics is a registered trademark and BSDArchitect, DFTAdvisor, DFTInsight, EDT, FastScan, MBIST Full-Speed, MBISTArchitect and MBIST Flex are trademarks of Mentor Graphics Corporation. All other company or product names are the registered trademarks or trademarks of their respective owners.
|
||||

