Posted Apr 25, 2012, by John Day
Registration is now open at www.mentor.com/events/iesf/detroit for the 12th IESF Conference for Automotive EE Design – June 14th, 2012 at the Hyatt Regency hotel in Dearborn, MI. Click to sign up if you haven’t already. I missed the last one and don’t want to miss this one – especially since this year I am on the program, speaking about automotive electronics reliability (shameless plug: http://books.sae.org/book-t-126) … Read More
Tags:
LEONI Wiring Systems,
Johnson Controls,
system analysis,
the GENIVI Alliance,
Automotive EE Design,
Hyatt Regency Hotel,
The Hansen Report,
automotive electronics reliability,
IBM Rational,
the Linux Foundation,
wire harness engineering,
IESF Detroit,
'FlexRay,
Infolytica,
CAN,
electronic thermal design and measurement,
Chrysler,
AUTOSAR,
Freescale Semiconductor,
Bishop & Associates,
GENIVI,
Delphi Automotive Systems,
Continental Automotive,
E/E systems design,
SAE International,
LIN,
power and signal design,
NXP Semiconductors,
Open Kernel Labs,
Mentor Graphics,
modeling and simulation,
Linux,
Mecel
Posted Aug 30, 2011, by John Day
Journalist/engineer Bruce Morey has just completed a book on automotive megatrends in which he looks at the likely future evolution of long-standing (internal combustion engines, transmissions, etc.) and newer technologies (smart cars, hydrogen fuel cells) and how they are all likely to come together – or not – in the next 20 years.
His book, “Automotive 2030–North America,” is available … Read More
Tags:
automotive industry megatrends,
Bruce Morey,
Automotive 2030 - North America,
SAE International
Posted Aug 10, 2011, by John Day
At least some parties are cooperating (don’t get me started), like the IEEE Standards Association (IEEE-SA) and SAE International.
The IEEE-SA/SAE International partnership in vehicular technology related to the Smart Grid, confirmed in February 2011 by a memorandum of understanding (MOU), is designed to accelerate more meaningful standards that drive greater improvements in market access, cost reductions … Read More
Tags:
IEEE Standards Association (IEEE-SA),
IEEE-SA/SAE International partnership in vehicular technology related to the Smart Grid,
charge coupler,
standards-development organizations,
SAE International,
SAE J1772