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Foundry Solutions Video Blog: TSMC OIP Conference

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Michael Buehler at DAC 2012

Interview with Mentor Graphics' Michael Buehler at DAC 2012.…View Technology Overview

David Abercrombie at DAC 2012

Interview with Mentor Graphics' David Abercrombie at DAC 2012.…View Technology Overview

Walden Rhines at DAC 2012

Interview with Mentor Graphics CEO Walden Rhines at DAC 2012.…View Technology Overview

Other Related Resources

Advanced Filling Techniques for N20 and Beyond – SmartFill at TSMC

White Paper: TSMC and Mentor Graphics have a long-standing collaboration in deploying key DFM technologies that meet the ever-changing requirements at advanced nodes. This paper describes the fill challenges faced by...…View White Paper

Aerial Image Retargeting (AIR): Achieving Litho-Friendly Designs

White Paper: In this work, we present a new technique to detect non-Litho-Friendly design areas based on their Aerial Image signature. The aerial image is calculated for the litho target (pre-OPC). This is followed...…View White Paper

Fast Process-Hotspot Detection Using Compressed Patterns

White Paper: This paper presents an approach for compressing litho hotspot pattern library that complies with general purpose pattern matching engine. This approach incorporates two techniques to achieve optimal pattern...…View White Paper

 
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