The 9th annual International Electrostatic Discharge Workshop (IEW) is being held May 4-7, 2015, at the Granlibakken Resort in Lake Tahoe, CA. The Call for Papers promises glimpses of “friendly but shy” bears and other wildlife at the conference site, located at 6,350 feet up in a mountain valley. Frankly, I prefer my bears to be decidedly shy, if that means they’ll be close enough … Read More
IC Manufacturing Blog
I have one opinion about electricity…if it’s invisible and it can kill you, it’s probably a good idea to avoid it. Now, some of my attitude is shaped by spending most of my childhood along the US Gulf Coast, where massive thunderstorms are an almost-daily occurrence during summer, and every little kid is taught to run for cover at the first rumble or flash. But that healthy fear means … Read More
Are you stressed out over the effects of stress in your IC designs? Relaaaax…help is here! A new publication on mechanical stress in ICs, co-edited by Valeriy Sukharev, Principal Engineer for Calibre R&D, has just been released by AIP Publishing. Stress-Induced Phenomena and Reliability in 3D Microelectronics includes papers from international workshops held in the U.S., Germany, and Japan. … Read More
In a SPIE.TV interview, Joseph Sawicki, Vice-President and General Manager of the Design to Silicon division of Mentor Graphics, explains the challenges of moving from design abstraction to physical implementation to a successful yield. “Design to silicon” is a complex process that continuously blends evolutionary trends, such as enhancements to 3D mask design and yield learning, with more … Read More
Design-style-based (systematic) defects are the major challenge to yield ramp at advanced process nodes, adding to the complexity of the basic process ramp. Because of its involvement in the design, manufacturing, and test, EDA is in a unique position to contribute toward the control, if not the solution, of this problem, through the use of automated pattern detection and analysis. Patterns can be useful … Read More
Failure analysis is a critical process in successful IC production. No matter how comprehensive the design rules are, no matter how thorough the verification strategies are, there will be chip failures in production. Understanding the cause of these failures is crucial to being able to implement design strategies and corrective technology to ensure the failures are eliminated in future designs. At its … Read More
If you’re designing large die such as a system-on-chip (SoC) with high power demands, you’d better be thinking about how to get the heat out. Poor heat dissipation can lead to a sub-optimal packaging solution from cost, size, weight and performance perspectives. Historically, designers assumed the die temperature was uniform. Not any more. Heating due to current leakage makes power dissipation … Read More
No, that’s not really a cry for help, at least not from me. But I can imagine a lot of designers saying just that as they try to understand and implement multi-patterning requirements. LELE? LELELE? LELELELE? SADP? SADP SIT? Whhaaaatttt???!!! And help we have. In spades. Our resident multi-patterning expert, David Abercrombie, not only writes extensively about multi-patterning issues, but he is … Read More
Photonics technology isn’t new, by any means, but what is new is the drive to leverage high-volume silicon-based semiconductor manufacturing foundries and processes to build chips that can create, sense, modulate, and transmit light. So says Michael White in his latest SiliconEdge column on Electronic Design. The biggest challenge in applying CMOS foundry processes to silicon photonics is creating … Read More
Every designer dreads the last-minute engineering change order, or ECO. Just when you think you’re done…you’re not. At 45nm and below, ECOs get even more difficult to implement, because fill now has a direct impact on design performance. A small re-routing can get complicated very quickly with the complex fill requirements of advanced nodes. Fortunately, help is available! On Semiconductor … Read More
The semiconductor industry can (and does) argue about when extreme ultraviolet lithography will be ready for production. However, the actual dates are irrelevant to those engineers who must prepare OPC tools and processes for the EUV-specific effects that will have to be managed in manufacturing. They are busy now, evaluating the impact of such challenges as the distortion caused by EUV shadowing. In … Read More
David Abercrombie recently met with Brian Bailey of Semiconductor Engineering to explain many of the concepts and issues of multi-patterning that he has been writing about for the last couple of years. If you want to understand the basics of multi-patterning requirements, 12 minutes is all you need to check out their first video: Tech Talk: Multipatterning on semiengineering.com. If the video piques … Read More
Are you attending the SPIE Advanced Lithography conference beginning Feb 23rd? If so, you’ll want to take note of the following Mentor presentations…there’s something for everyone. For detailed abstracts, go to the SPIE Technical Summaries document. Feb 25, 4:40pm: Feasibility of compensating for EUV field edge effects through OPC Feb 25, 5:20pm: Pattern fidelity verification for logic design in EUV … Read More
Download the latest version of our guide to multi-patterning design and debugging, containing links to all of David Abercrombie’s detailed educational articles on SemiEngineering.com, along with links for complementary reference and learning options. Whether you are already working on designs with multi-patterning requirements, or just beginning multi-patterning work, you will benefit from David’s … Read More
Foundries, both pure-play and independent device manufacturers (IDM), rigorously compete for market share. One factor that helps them get and keep business is turnaround time (TAT). Until recently, companies could reduce TAT by adding computer hardware, fine-tuning OPC recipes, improving input hierarchical handling of designs, and upgrading to new software versions with new functionality and performance … Read More
- Friendly but Shy Bears, and other EOS/ESD Issues
- It's Electrifying!
- Manage Your Stress...Advice from the Experts
- Testing the Boundaries of Good Design
- Making the Impossible -- Dealing with Patterns Throughout the Design and Manufacturing Flow
- Failing to Succeed
- Global Warming
- Won't You Please, Please Help Me?
- I See the Light!
- Are You ECO-Friendly?
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