Calibre xRC

  • Delivers unparalleled performance on ASIC, memory, analog, SoC designs, etc. with no trade-off in accuracy
  • Single rule file can drive DRC, LVS, and Calibre xRC functionality
  • Reads LVS data structures to integrate parasitic information with intentional circuit elements
  • Model-based engine calculates intrinsic and coupling capacitances for all nets using the same high degree of accuracy
  • Integrates with Calibre DRC and LVS, Calibre Interactive, Calibre View and Calibre RVE, which offer powerful verification and cross-probing capabilities

Benefits:

  • Extraction and simulation results correlate closely with silicon measurements
  • Offers AMS SoC designers a single parasitic extraction solution that is independent of design style or flow
 
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Online Event

IC Device and Interconnect Extraction for Analysis
This online seminar covers current IC device and interconnect modeling practices and techniques for analysis in the analog/RF (cell and block), digital (full chip) and on-chip memory domains as well as future trends in IC physical modeling.

 
Block-Level Physical Design & Verification

Challenges to Silicon Modeling in the Nanometer Era
 
Parasitic Effects, Nanometer Silicon Modeling and Calibre xRC
 
Deflecting the Design Diversity Dilemma: Methods for Improving Mixed-Signal Post-Layout Analysis in an SoC Flow
 
 
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