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IC Design Blog

Posts tagged with 'DRC'

14 Mar, 2014

Are You ECO-Friendly?

Posted by Shelly Stalnaker

Shelly Stalnaker Every designer dreads the last-minute engineering change order, or ECO. Just when you think you’re done…you’re not. At 45nm and below, ECOs get even more difficult to implement, because fill now has a direct impact on design performance. A small re-routing can get complicated very quickly with the complex fill requirements of advanced nodes. Fortunately, help is available! On Semiconductor … Read More

P&R, Jeff Wilson, place and route, 45nm, 20nm, IC Design, smart fill, ic manufacturing, DRC, ECO fill

15 Jan, 2014

2014 is Underway! What's on Your Calendar?

Posted by Shelly Stalnaker

Shelly Stalnaker What’s coming in 2014? What new challenges await? Are you ready? Get a heads-up on some of the trends and events of the next 12 months with two articles. First, if you’re contemplating, or already working on, 2.5D and 3D ICs, you should take a look at 3D IC Design: Outlook for 2014 on 3D InCites. Written by Joseph Sawicki, this article can help you prepare for your 3D IC implementations. … Read More

Design for Manufacturing, Calibre, Design Rule Checking, 14nm, IC Design, 16nm, IC Verification, MEMs, 10nm, Physical Verification, 3D-IC, DRC, 3DIC, FinFET, 2.5D, Foundry, 20nm

15 Jan, 2014

Shelly Stalnaker DRC- and DFM-clean designs can still have hundreds to thousands of violations that must be debugged and corrected. How? Why? Mismatches between a router’s simplified tech file and the complete (and complex) signoff design rule decks at advanced nodes are generating significant numbers of DRC/DFM errors that can wreak havoc on your tapeout schedules. In particular, we’re seeing greater visibility … Read More

tech file, tapeout, DRC, Design Rule Checking, P&R, signoff, IC Design, IC Verification

13 Dec, 2013

Shelly Stalnaker Just like blueprints give an architect a visual representation of a building, design patterns provide engineers with a visual depiction of complex layout geometries. Design patterns have become a useful tool throughout design, verification, and test processes. This Design-to-Silicon white paper explains how Calibre Pattern Matching software can help you implement automated pattern capture and pattern … Read More

pattern capture, Mentor Graphics, Pattern Matching, D2S, Design Rule Checking, Calibre Pattern Matching, SVRF, Foundry, hotspot detection, yield detractors, design waivers, DRC

13 Dec, 2013

The Trouble With Triples—Part 1

Posted by Shelly Stalnaker

Shelly Stalnaker Triple patterning is not just double patterning with an extra color! Our resident expert, David Abercrombie, introduces the basics of triple patterning and explains the new challenges it brings to the layout and verification flow in his ongoing series for for SemiconductorEngineering’s Manufacturing and Design segment. If you’re even thinking about advanced node designs, this is a must-read. Bonus references … Read More

Foundry, DRC, multipatterning, 14nm, 16nm, 10nm, triple patterning, double patterning, 20nm, decomposition

13 Dec, 2013

Shelly Stalnaker Jean-Marie Brunet examines the reasons why the “tapeout crunch” is getting worse and worse at advanced nodes, and suggests some possible solutions, in this forward-looking article written for SemiconductorEngineering.com. … Read More

DRC, digital IC, Foundry, tech files, tapeout, 14nm, rule decks, signoff, 16nm, SoC, 10nm, SVRF, IP, Design Rule Checking, P&R, router, 20nm, Routing, Debugging

13 Dec, 2013

Shelly Stalnaker No one wants to edit a foundry rule deck—it’s like tugging on Superman’s cape. But there are many ways to customize the input to a Calibre job without modifying the foundry rule deck. To learn more, watch one of our short, to-the-point How-To videos on our IC Nanometer Design channel on YouTube. Oh, and if you can’t find what you’re looking for? Suggest a new topic! … Read More

runsets, rule decks, configurations, DRC, Calibre, rule checks, ERC, Foundry

29 Nov, 2010

Layout Density and the Analog Cell

Posted by John Ferguson

John Ferguson Density and the Analog Cell Analog design is a very sensitive business. Unlike the digital world, where circuits are on or off, and have built in hysteresis to prevent inadvertent toggling, analog circuitry is intentionally designed to respond to minor fluctuations in the signal. As a result, analog layout is riskier than digital. To prevent race conditions, or minor (yet potentially catastrophic) … Read More

density, DRC, analog, layout

15 Mar, 2010

Assuring Software Quality

Posted by John Ferguson

John Ferguson In my last blog I discussed the importance of support and the value it provides in the physical verification space.  As indicated, one of the key components in providing support is having an infrastructure helps to assure quality software releases in the first place.  In this blog, I will provide more insight into the procedures in place within the Calibre organization that help to ensure the high standards … Read More

DRC, Mentor, Calibre, Quality, Physical Verificaiton, PV

27 Jan, 2010

The Value of Support

Posted by John Ferguson

John Ferguson When asked about the value that the Calibre platform brings to the design community, most folks will respond with performance, foundry support, and ease of debugging. While these are all valuable aspects and traits of Calibre, there is one more benefit that is often taken for granted: support. The word “support” is something bandied around loosely in EDA. Saying you have good support is akin to saying … Read More

DRC, EDA Ssoftware Support, Calibre, LVS, Physical Verification

15 Jan, 2010

Michael White Historically, design rule checking (DRC) was a black or white proposition—either you passed all your DRC’s or you fixed the errors until you did pass.  Fast forward to today where much/most of the IP you use is from 3rd parties and/or your product has an increasing percentage of memory content and your design is never DRC clean at tape out.  Your design team is now constantly waiving over and over and … Read More

Foundry, Foundries, IC Design, DRC, SVRF, Tax, Waiver, Calibre, Physical Verification, Fab-lite, Productivity, Fabless, Sign-off, eqDRC, SoC, Equation-Based DRC

17 Dec, 2009

Does SVRF Direct Read Make Sense?

Posted by Michael White

Michael White Since DAC we have heard a lot about physical verification tools claiming they can read the Calibre(R) SVRF/TVF syntax natively. This blog explores why competitive EDA companies are trying to use Calibre SVRF/TVF, the challenges involved, and the risks to customers. Why Do Competing PV Products Want to Use Calibre SVRF? Calibre is a primary sign-off standard at all the major foundries and IDMs, and … Read More

Foundries, Fabless, Foundry, TVF, Translators, Direct Read, PV, Sign-off, DRC, SVRF, Calibre, Syntax, IC Design, Equation-Based DRC, IDM, Fab-lite, Native Read, Physical Verification, eqDRC

15 Dec, 2009

John Ferguson I don’t normally take the time to respond to any of the various competitive claims out there. But recently in ESNUG 483, item #2, there was a posting entitled “We recently dumped Mentor Calibre for Magma Quartz DRC/LVS” (http://www.deepchip.com/items/0483-02.html) that I feel needs to be addressed because it is misleading. So let me lay out the facts to set the record straight. Tezzaron Semiconductor … Read More

Deepchip, DRC, Calibre, Quartz, Tezzaron, LVS, Physical Verification

20 Nov, 2009

IBM Addresses Leakage

Posted by David Abercrombie

David Abercrombie

In case you missed the webinar by Jim Culp on November 3rd, I wanted to give you an opportunity to see what you missed. Jim is a Senior Engineer in IBM’s Advanced Physical Design and Technology Integration team. He is leading a team in the development of Parametric DFM and the mitigation of Circuit Limited Yield (CLY). During the webinar he discussed how CLY is becoming the leading contributor to yield

Read More

Physical Verification, Yield, DRC, Leakage, IC Design, Design Quality, IC Verification, Design for Manufacturing

30 Sep, 2009

The Biggest Loser?

Posted by John Ferguson

John Ferguson A new season of NBC’s “The Biggest Loser” recently started. Have you seen this show? My wife, Cherie, loves it; she finds it inspirational to watch these folks put them through such a tough ordeal in order to improve their health. I enjoy it as well, though my motives are completely different. There are some pretty large individuals on that show. Somehow watching them makes me feel less self-conscious … Read More

DRC, Performance, Calibre, Runtime, Scaling, Physical Verification, PV

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