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IC Design Blog

Posts tagged with 'Pattern Matching'

13 Dec, 2013

Shelly Stalnaker Just like blueprints give an architect a visual representation of a building, design patterns provide engineers with a visual depiction of complex layout geometries. Design patterns have become a useful tool throughout design, verification, and test processes. This Design-to-Silicon white paper explains how Calibre Pattern Matching software can help you implement automated pattern capture and pattern … Read More

pattern capture, Mentor Graphics, Pattern Matching, D2S, Design Rule Checking, Calibre Pattern Matching, SVRF, Foundry, hotspot detection, yield detractors, design waivers, DRC

28 Jan, 2010

Michael White Design rule checking (DRC) or physical verification used to be easy.  For example, run some 1-D width and spacing checks to ensure things will resolve and won’t short and you are good to go.  These checks were simple to write, fast to run and understandable, and quick to debug.  Today is a new world order, where none of these attributes are true anymore.  An increasing number of checks are 2-D, very … Read More

IDM, IC Design, Pattern Matching, SoC, eqDRC, Calibre, Physical Verification, Fabless, Productivity, Foundries, Equation-Based DRC, PV, Sign-off, Fab-lite

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