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IC Design Blog

Posts tagged with 'Scoring'

20 Aug, 2009

David Abercrombie I got some questions from my last installment of this series asking for some pictures of defects that caused yield issues in production that could have been avoided during design. It struck me that most designers probably never get a chance to see the manufacturing problems their designs encounter. Since my background is in the fab, I wrongly assumed everyone had lived through the same pain as myself. … Read More

Reliability, IC Verification, Yield, Design Quality, Design for Manufacturing, Scoring, Design Rules, IC Design, Physical Verification, Design Rule Checking

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