IC Design Blog

Posts tagged with 'thin oxide'

Gate Oxide Breakdown Failures Highlight Industry Need for New Electrical Rule Checking Tools

Posted Feb 10, 2011, by Matthew Hogan

Designers are discovering a new class of design errors that is difficult to check using more traditional methods, and can potentially affect a wide range of IC designs, especially where high reliability is a must. There errors require electrical rule checking to complement the tradition layout checks. Electrical rules are relatively complex, non-standard, and growing in number and type, creating a … Read More

Tags: Low Power, PERC, ERC, thin oxide, Verification