Implementing DFM Analysis and Enhancement to Maximize Yield
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Yield has always been an issue, but with the progression of complex, high-performance nanometer designs, acceptable yield has become more difficult to attain. While manufacturers have traditionally handled yield management, more pressure is being placed on designers to adopt methods that help ensure success.
This presentation and demo covers how to maximize yield by: 1) Identifying the causes of design-to-process interactions and determining how these causes influence yield; 2) Analyzing where issues occur in the design and where these issues can be corrected, enabling yield prediction; and 3) Making the necessary changes, both manually and automatically, that optimize yield.
Who Should Attend
- Layout Designers
- CAD Managers
- Project Managers
- Quality Engineers
- Anyone interested in discovering ways to improve yield
What You Will Learn
- How to assess and analyze the "grayscale" between minimum spacing rules and recommended rules for prioritizing layout modifications
- How Calibre Yield Analyzer determines the location of highest improvement opportunities and allows yield grade calculation by issue, window, etc.
- How to handle foundry DFM recommended rules for improved yield
- How Calibre locates, prioritizes and visualizes critical features to help designers make "fix or fab" decisions on DFM issues