Implementing DFM Analysis and Enhancement to Maximize Yield
Online Event RegistrationClick Here to Register and View Today!OverviewYield has always been an issue, but with the progression of complex, high-performance nanometer designs, acceptable yield has become more difficult to attain. While manufacturers have traditionally handled yield management, more pressure is being placed on designers to adopt methods that help ensure success. This presentation and demo covers how to maximize yield by: 1) Identifying the causes of design-to-process interactions and determining how these causes influence yield; 2) Analyzing where issues occur in the design and where these issues can be corrected, enabling yield prediction; and 3) Making the necessary changes, both manually and automatically, that optimize yield. Who Should Attend
What You Will Learn
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