DFM Strategy for Yield Closure
Online Event Registration
Click Here to Register and View Today!Overview
This online seminar tackles the challenge of DFM and what the Calibre team is doing to address the problem. View this seminar to discover the latest causes of yield problems and how Mentor Graphics can help you identify, analyze and modify your designs to increase yield.Who Should Attend
Anyone looking to improve the bottom line by increasing yield of their ICs.
What You Will Learn
How Calibre's 4th generation verification engine has been expanded to address the challenges of DFM
What solutions Mentor Graphics offers to help design teams:
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Identify the types of failures
Analyze and prioritizing the failures -
Modify the design to improve the yield
- What Calibre is doing to address random, systematic and parametric yield problems