Calibre YieldAnalyzer

  • Determines location of the most significant yield improvement opportunities and provides graded yield metrics by issue, cell, window, etc.
  • Assesses the weighted "grayscale" of features that fail to meet recommended rules.
  • Assesses the weighted sensitivity to random particles using critical area analysis.
  • Runs analysis directly on GDSII, OASIS, MilkyWay, and OpenAccess design databases.

Benefits:

  • Provides manufacturing teams a method of communicating yield and yield modeling information to the design teams.
  • Executes and visualizes analysis from within all the popular layout environments, including Mentor Graphics IC Station and Calibre DESIGNrev, Cadence® Virtuoso/Encounter, Synopsys® Astro and Magma BlastFusion.
  • Helps designers see through the fog of DFM rule violations, enabling the ability to make decisions and trade-offs about yield impact issues.

 

                                                       Original Design Data

 

DRC Results

Calibre YieldAnalyzer

                                       Calibre YieldAnalyzer

 

DFM Results

 





Product Resources

Online Tutorial

Approaching Yield in the Nanometer Age

The Framework for an Extensible DFM Methodology

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