Mentor Forum - Calibre Tech Day
TAGS: 14nm, 20nm, 28nm, 3D IC, 45nm, Calibre, Calibre xACT 3D, Calibre xRC, Calibre_LVS, Design Rule Checking, double patterning, DRC, Equation-Based DRC, FinFET, Foundry, Foundry Solutions, full depleted SOI, GDSII, Hierarchical LVS, Hierarchical_LVS, IC, IC Verification, LVS, MTCMOS, MugFET, Multi-Patterning, nmLVS, Pattern Matching, PERC, Physical Verification, Process Variation, PV, RVE, Sign-off, SVRF, tape-out, TowerJazz, TSMC, Waiver, Waivers