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Curing Reliability Issues at the IC Design Stage

Overview

This presentation offers an introduction to these problems and explains how advanced EDA tools can help in this area.

Starting from 90nm processes, the degradation effects due to Negative Bias Temperature Instability (NBTI) and Hot Carriers Injection (HCI) are a major reliability threat that can no longer be ignored. These wearing effects make the lifetime of ICs comparable to the expected product lifetime in the field.

Even worse, HCI and NBTI are mechanisms whose actual effect very much depends on the design itself. The circuit architecture, the chosen geometries and most importantly, the actual stimuli applied to the circuit during operation, strongly determine the magnitude and the speed of degradation. This dependence to the design itself explains why lots of IC design companies want to be able to integrate the reliability prediction capability in the design cycle itself. Thus a tight and transparent integration of the reliability simulation tool inside the reference circuit simulation tools is an attractive solution.

What You Will Learn

  • How to model accurately IC degradation and failure mechanisms due to Negative Bias Temperature Instability (NBTI) and Hot Carrier (HC) effects
  • How such reliability models can be fully integrated in the design flow to help optimizing the circuit lifetime

About the Presenter

Presenter Image Marius Sida

Marius is a Product Specialist for Analogue and Mixed Signal solutions. His responsibilities include supporting major customers in the area of RF and analog-mixed signal design and verification, across Europe. He brings over 20 years of experience in design and EDA.

Prior to joining Mentor Graphics, Marius worked with Anacad Design systems in Germany in the areas of analogue behavioral modeling, design optimization and design centering and at IIRUC in Romania, in the HW test laboratory.

Marius hold a Master of Electronics and Telecommunications from the Polytechnical Institute Timisoara, Romania.

Who Should View

  • IC designers concerned with long-term reliability issues due to NBTI and HCI degradation effects
  • Project managers who want to make sure fabricated ICs will not start failing after a few years, months or... weeks of operation

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