IP Scoring Using TSMC DFM Kits
On-demand Web Seminar
At advanced technology nodes, responsibility for managing product yield belongs more frequently with the designer. Sophisticated DFM analysis tools have been available now for some time from EDA vendors however the methodology behind implementing effective yield analysis and improvement programmes can still be unclear and is open to user interpretation.
This talk proposes a method of scoring IP from cell to block level for DFM quality which provides a basis for building high DFM quality into your SoC and gaining maximum yield potential. The scoring process not only provides a mechanism to rank the IP cells and show potential improvement, but additionally is a correlation point for verifying actual silicon yield levels with projected results. Using this technique a programme can be implemented to enable yield issues to be identified and proven through correlation with silicon to improve DFM quality.
What You Will Learn
- Rank a design with respect to yield based on a DFM score
- Build a yield analysis flow around different DFM tools
- Correlate results from silicon with predicted results from DFM tools
About the Presenter
Currently a Calibre DFM Specialist, Ian Smith joined Mentor Graphics in 1996 in the Design Kit Development Group developing kits for the IC tools. He changed roles to become a TME for IC Station in the CICD division where his responsibilities included: tool development, setting requirements and providing and delivering AE training courses. Subsequently, he transitioned to the role of European Product Specialist where his was responsible for the IC Flow backend tools, Calibre DRC, LVS and DESIGNrev, and for providing pre and post sales support throughout Europe.
Prior to joining Mentor, he was employed at Philips Semiconductors in Southampton as an IC design engineer developing products from concept to production for the consumer market. He also managed the Library Design Group providing design services supporting product development.
Who Should View
- Engineers researching potential applications and benefits for DFM, in areas of design and manufacture
- Engineers wishing to manage product yield