December 2007
Mentor Graphics Announces Industry’s First Multi-mode Multi-corner Signal Integrity Solution for 65/45nm Dec 10, 2007
November 2007
Mentor Graphics Olympus-SoC Place and Route System used by STMicroelectronics to Tape Out Set-Top Box Chip Nov 27, 2007
Mentor Graphics and TSMC Collaborate to Release 65 nanometer RF Design Kits Nov 13, 2007
June 2007
Mentor Graphics Acquires Sierra Design Automation; Answers Industry Need for Design-to-Fab Flow for 65 and 45 Nanometers Jun 11, 2007
Mentor Graphics Collaborates with TSMC to Provide Advanced DFM Capabilities in Reference Flow 8.0 Jun 5, 2007
Mentor Graphics’ DFM Solution Qualified by Common Platform Technology Alliance for 45nm and 65nm Jun 4, 2007
May 2007
Chartered and Mentor Graphics Team to Offer Technology Design Kits for 65 and 90 Nanometer Common Platform Technology Processes May 31, 2007
Benefits of Mentor Graphics’ Calibre LFD Demonstrated by Infineon-Chartered Collaboration May 30, 2007
Mentor Graphics and UMC Deliver Analog Mixed-Signal Reference Flow May 23, 2007
Mentor Graphics and Fujitsu Collaborate to Provide Calibre LFD Solution for Fujitsu’s Internal and Fabless Customers May 22, 2007
UMC Expands Support for Mentor Graphics’ Calibre YieldAnalyzer to Deliver Production Proven DFM Flow May 15, 2007
March 2007
Mentor Graphics Customers Reap Success with ADVance MS Mixed-Signal Verification Platform Mar 1, 2007
January 2007
STARC Standardizes on Calibre YieldAnalyzer as Reference Tool in DFM Flow for Critical Area Extraction Jan 24, 2007