IC Nanometer Design News Archive

November 2009

Juniper Networks Completes World’s First Network Instruction Set Processor Design Using Mentor Graphics Calibre and Design-for-Test Solutions Nov 3, 2009

October 2009

Mentor Graphics Analog/mixed-signal Simulators Enable Widex to Verify Wireless Chip for New Clear440 Product Oct 27, 2009

TSMC Selects Calibre Physical Verification Platform for Integrated Sign-off Flow Oct 22, 2009

GLOBALFOUNDRIES Selects Mentor Graphics Calibre Platform for Computational Lithography and DFM Enablement Oct 16, 2009

September 2009

Mentor Graphics Provides Comprehensive Low Power Solution in TSMC Reference Flow 10.0 Sep 21, 2009

July 2009

Mentor Graphics Underscores Low-Power Strategy with Vista Architecture-Level Power Solution Jul 27, 2009

Mentor Graphics Provides Support for TSMC iPDKs Jul 23, 2009

Mentor Graphics Announces Complete Design through Manufacturing Solution in TSMC Reference Flow 10.0 Jul 23, 2009

Mentor Releases New Calibre Versions Using Interoperable iDRC and iLVS Formats Introduced by TSMC Jul 23, 2009

May 2009

Mentor Graphics Announces All-Calibre Physical Verification and DFM Flow for Advanced IC Designs at Fujitsu Microelectronics May 26, 2009

April 2009

Mentor Graphics Unveils Advanced Low Power Features in its Olympus-SoC Place-and-Route Platform Apr 6, 2009

March 2009

Mentor Graphics Provides Complete 3D Variability Solution Addressing Density and Thickness Challenges Mar 17, 2009

Mentor Graphics Eldo Simulator used by STMicroelectronics to Characterize 32nm Cell Libraries Mar 5, 2009

Cambridge Silicon Radio Limited Successfully Deploys Calibre DFM Solutions to Help Drive Rapid Process Migration Mar 3, 2009

Mentor Graphics Olympus P&R and Calibre Verification Platforms Qualified for 32nm IC Designs at STMicroelectronics Mar 2, 2009

February 2009

Mentor Graphics’ Olympus-SoC Place-and-Route System Wins 2009 DesignVision Award Feb 13, 2009

January 2009

Mentor Graphics and Freescale Expand Collaboration to Improve Manufacturing and Testing of Nanometer Technologies Jan 26, 2009