Mentor Graphics Calibre Platform Provides Integrated DFM Flow for TSMC 65nm Technologies
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WILSONVILLE, Ore., May, 17, 2006 - Mentor Graphics Corporation (Nasdaq: MENT) today announced that an integrated set of best-in-class tools from the Calibre ® design-to-silicon platform supports TSMC's 65 nanometer (nm) technology. This broad set of Calibre tools set the standard of excellence in terms of extending existing tools and platforms to address the issue of achieving acceptable yield in nanometer technologies. "Calibre LFD provides a unique approach to Model Based Verification. This makes a significant difference in determining a layout topology that is optimized across process window conditions," said Ed Wan, Sr. Director Design Services Division, TSMC. "In addition, the single environment for yield analysis found in Calibre YieldAnlyzer is essential for a complete solution. The biggest advantage is that the single environment greatly simplifies the task of evaluating trade offs, and gives designers a way to compare how each decision impacts yield." |

