The design and verification of high-speed transceivers at the leading-edge process nodes (20 nm and below) present design teams with tremendous challenges. These high data rate (up to 28.1 Gbps) transceivers need to support high bandwidth, low latency, and low power and be configurable to meet system designer requirements. In order to ensure high confidence in both performance and configurability a new validation flow is required. This paper provides a short introduction to a 20 nm transceiver implementation supporting data rates up to 28.1 Gbps, outlining the circuit verification challenges, and introducing a new methodology for circuit validation and characterization across operational, environmental, and process conditions. Details of the validation flow are provided along with the results obtained by using the new methodology.