Post-Layout Analysis with Eldo and Eldo RF
Curing Reliability Issues at the IC Design Stage
This presentation offers an introduction to these problems and explains how advanced EDA tools can help integrate the reliability prediction capability in the design cycle itself.
Characterizing PLL Jitter from Power Supply Fluctuation Using Mixed-Signal
Characterizing PLL Jitter is important yet challenging. Usually done through transistor-level transient analysis, slow simulation speed has been the major bottleneck preventing jitter from being characterized...
A Nonlinear S-parameters Behavioral Model for RF LNAs
A nonlinear behavioral model for radio frequency low noise amplifiers (LNA’s) is presented. The model captures effects of nonlinearity, output power saturation, noise figure and port impedance mismatch....